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Electron Microbeam Analysis pp 75–92Cite as

Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces

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Part of the book series: Mikrochimica Acta ((MIKROCHIMICA,volume 12))

Abstract

Both analytical electron microscopy and high-resolution electron microscopy are widely used to investigate the structure of and defects in materials. The spatial resolution of the analytical electron microscope (AEM) is < 5 nm and the point-to-point resolution of the high-resolution electron microscope (HREM) is small enough to image lattice planes in metals and ceramics direcdy. AEM and HREM are described in this paper with special emphasis on the study of interfaces between single crystal Nb-films grown by molecular beam epitaxy (MBE) on (0001) planes of sapphire (A12O3)-substrates. From these specimens, cross-sectional specimens with thickness < 20 nm were prepared, so that the Nb/A1203-interface could be investigated by AEM and HREM. AEM studies revealed that A12O3 was dissolved by the Nb so that Al could be detected in the Nb adjacent to the interface. The atomistic structure of the interface was identified by HREM. Defects at or close to the interface were analyzed and a model of the atomistic arrangements of the interface in the relaxed, “perfect” regions is described with a discussion of the results.

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Author information

Authors and Affiliations

  1. Max-Planck-Institut für Metallforschung, Seestrasse 92, Stuttgart, Federal Republic of Germany, D-W-7000

    Manfred Rühle

Authors
  1. Manfred Rühle
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Editor information

Editors and Affiliations

  1. Agricultural Research Department (DLO-NL), State Institute for Quality Control of Agricultural Products (RIKILT-DLO), Wageningen, The Netherlands

    Abraham Boekestein (Head Department Instrumental Analysis) (Head Department Instrumental Analysis)

  2. Institute of Mineralogy, University of Salzburg, Austria

    Miodrag K. Pavićević

  3. Faculty of Mining and Geology, University of Belgrade, Yugoslavia

    Miodrag K. Pavićević

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© 1992 Springer-Verlag Wien

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Rühle, M. (1992). Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces. In: Boekestein, A., Pavićević, M.K. (eds) Electron Microbeam Analysis. Mikrochimica Acta, vol 12. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6679-6_5

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  • DOI: https://doi.org/10.1007/978-3-7091-6679-6_5

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-82359-0

  • Online ISBN: 978-3-7091-6679-6

  • eBook Packages: Springer Book Archive

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