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Synchrotron Radiation Induced X-Ray Microfluorescence Analysis

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Microbeam and Nanobeam Analysis

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 13))

Abstract

μ-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for μ-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of μ-XRF are contrasted to that of other microanalytical techniques. Also, this issue of quantification of μ-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.

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© 1996 Springer-Verlag Wien

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Janssens, K. et al. (1996). Synchrotron Radiation Induced X-Ray Microfluorescence Analysis. In: Benoit, D., Bresse, JF., Van’t dack, L., Werner, H., Wernisch, J. (eds) Microbeam and Nanobeam Analysis. Mikrochimica Acta Supplement, vol 13. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6555-3_5

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  • DOI: https://doi.org/10.1007/978-3-7091-6555-3_5

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-82874-8

  • Online ISBN: 978-3-7091-6555-3

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