Abstract
μ-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for μ-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of μ-XRF are contrasted to that of other microanalytical techniques. Also, this issue of quantification of μ-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.
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Janssens, K. et al. (1996). Synchrotron Radiation Induced X-Ray Microfluorescence Analysis. In: Benoit, D., Bresse, JF., Van’t dack, L., Werner, H., Wernisch, J. (eds) Microbeam and Nanobeam Analysis. Mikrochimica Acta Supplement, vol 13. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6555-3_5
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DOI: https://doi.org/10.1007/978-3-7091-6555-3_5
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