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Statistische Grundlagen

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Book cover Grundlagen der Kristallelektronik

Part of the book series: Technische Elektrodynamik ((2412,volume 2 / 4))

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Zusammenfassung

Gegeben seien M mittels der ganzen Zahlen 1 ≦ K ≦ ein-für allemal eindeutig individualisierbare Systeme physikalisch identischer Eigenschaften. Das K-te System beherberge gerade die Energie u = u(K); doch sei diese jeweils nur einer der diskreten Stufen Uj fähig, die ihrerseits sämtlich aus ein- und demselben Urquantum u(0) der Energie zusammengesetzt sind.

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Literaturhinweise

  • Blakemore, J.: Semiconductor Statistics. International Series of Monographs on Semiconductors. Volume 3. Pergamon Press, Oxford-London-New York-Paris 1962.

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Authors and Affiliations

  1. Israel Institute of Technology, Haifa, Israel

    Franz Ollendorff (Dipl.-Ing., Dr.-Ing., Dr.-Ing. E. h., Research Professor am Technion, Fellow, Member, Mitglied)

  2. I. R. E., USA

    Franz Ollendorff (Dipl.-Ing., Dr.-Ing., Dr.-Ing. E. h., Research Professor am Technion, Fellow, Member, Mitglied)

  3. I. E. E., England

    Franz Ollendorff (Dipl.-Ing., Dr.-Ing., Dr.-Ing. E. h., Research Professor am Technion, Fellow, Member, Mitglied)

  4. Israelischen Akademie der Wissenschaften, Israel

    Franz Ollendorff (Dipl.-Ing., Dr.-Ing., Dr.-Ing. E. h., Research Professor am Technion, Fellow, Member, Mitglied)

Authors
  1. Franz Ollendorff
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© 1966 Springer-Verlag, Wien

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Ollendorff, F. (1966). Statistische Grundlagen. In: Grundlagen der Kristallelektronik. Technische Elektrodynamik, vol 2 / 4. Springer, Vienna. https://doi.org/10.1007/978-3-7091-3028-5_1

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  • DOI: https://doi.org/10.1007/978-3-7091-3028-5_1

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-7091-3029-2

  • Online ISBN: 978-3-7091-3028-5

  • eBook Packages: Springer Book Archive

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