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Machine Learning for Cyber Physical Systems pp 107–115Cite as

Enabling Self-Diagnosis of Automation Devices through Industrial Analytics

Enabling Self-Diagnosis of Automation Devices through Industrial Analytics

  • Carlos Paiz Gatica5 &
  • Alexander Boschmann5 
  • Conference paper
  • Open Access
  • First Online: 18 December 2018
  • 9064 Accesses

Part of the Technologien für die intelligente Automation book series (TIA,volume 9)

Abstract

This paper shows how automation components can be enhanced with self-monitoring capabilities, which are more effective than traditional rule-based methods, by using Industrial Analytics approaches. Two application examples are presented to show how this approach allows the realization of a predictive maintenance strategy, while drastically reducing the realization effort. Furthermore, the benefits of a flexible architecture combining edge- and cloud-computing for the realization of such monitoring system are discussed.

Keywords

  • Industrial Analytics
  • Predictive Maintenance
  • Machine Learning
  • Edge Computing
  • Feature Engineering
  • Self-Monitoring

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Author information

Authors and Affiliations

  1. Weidmüller Interface GmbH & Co. KG, Detmold, Germany

    Carlos Paiz Gatica & Alexander Boschmann

Authors
  1. Carlos Paiz Gatica
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  2. Alexander Boschmann
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Corresponding author

Correspondence to Carlos Paiz Gatica .

Editor information

Editors and Affiliations

  1. Institut für Optronik, Systemtechnik und Bildauswertung, Fraunhofer, Karlsruhe, Germany

    Prof. Dr. Jürgen Beyerer

  2. MRD, Fraunhofer Institute for Optronics, System Technologies and Image Exploitation IOSB, Karlsruhe, Germany

    Dr. Christian Kühnert

  3. inIT - Institut für industrielle Informationstechnik, Hochschule Ostwestfalen-Lippe, Lemgo, Germany

    Prof. Dr. Oliver Niggemann

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Open Access This chapter is licensed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence and indicate if changes were made.

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Cite this paper

Gatica, C.P., Boschmann, A. (2019). Enabling Self-Diagnosis of Automation Devices through Industrial Analytics. In: Beyerer, J., Kühnert, C., Niggemann, O. (eds) Machine Learning for Cyber Physical Systems. Technologien für die intelligente Automation, vol 9. Springer Vieweg, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-58485-9_12

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  • DOI: https://doi.org/10.1007/978-3-662-58485-9_12

  • Published: 18 December 2018

  • Publisher Name: Springer Vieweg, Berlin, Heidelberg

  • Print ISBN: 978-3-662-58484-2

  • Online ISBN: 978-3-662-58485-9

  • eBook Packages: Intelligent Technologies and RoboticsIntelligent Technologies and Robotics (R0)

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