Field calibration issues

  • R. G. ForbesEmail author
Part of the Condensed Matter book series (volume 45B)


This chapter discusses various techniques in calibrating the field and issues relating to the calibration of evaporation fields.


  1. [56D]
    Dyke, W.P., Dolan, W.W.: Adv. Electr. Electron. Phys. 8, 89 (1956)CrossRefGoogle Scholar
  2. [56Mur]
    Murphy, E.L., Good Jr., E.H.: Phys. Rev. 102, 1464 (1956)ADSCrossRefGoogle Scholar
  3. [61G]
    Gomer, R.: Field Emission and Field Ionization. Harvard University Press, Cambridge, MA (1961)Google Scholar
  4. [61M]
    Müller, E.W., Young, R.D.: J. Appl. Phys. 32, 2425 (1961)ADSCrossRefGoogle Scholar
  5. [65V]
    Van Oostrom, A.G.J.: PhD thesis, University of Amsterdam (1965)Google Scholar
  6. [66N]
    Nakamura, S.: J. Electron Microsc. (Japan). 15, 279ver (1966)Google Scholar
  7. [69M]
    Müller, E.W., Tsong, T.T.: Field Ion Microscopy: Principles and Applications. American Elsevier, New York (1969)CrossRefGoogle Scholar
  8. [71B]
    Boyes, E.D., Turner, P.J., Southon, M.J.: Proceedings of the 25th Anniversary Meeting EMAG Institute of Physics, p. 256. IOP, London (1971)Google Scholar
  9. [77S]
    Sakurai, T., Müller, E.W.: J. Appl. Phys. 48, 2618 (1977), and references therein.ADSCrossRefGoogle Scholar
  10. [78T]
    Tsong, T.T.: Surf. Sci. 70, 211 (1978)ADSCrossRefGoogle Scholar
  11. [82B]
    Biswas, R.K., Forbes, R.G.: J. Phys. D Appl. Phys. 15, 1323 (1982)ADSCrossRefGoogle Scholar
  12. [82K]
    Kingham, D.R.: Surf. Sci. 116, 273 (1982)ADSCrossRefGoogle Scholar
  13. [84C]
    De Castilho, C.M.C., Kingham, D.R.: J. Phys. 45, C9–77 (1984)Google Scholar
  14. [84K]
    Kellogg, G.L.: Phys. Rev. B29, 4304 (1984)ADSCrossRefGoogle Scholar
  15. [86C]
    De Castilho, C.M.C., Kingham, D.R.: Surf. Sci. 173, 75 (1986)ADSCrossRefGoogle Scholar
  16. [86S]
    Swanson, L.W.: Appl. Phys. A41, 223 (1986)ADSCrossRefGoogle Scholar
  17. [89S]
    Sakurai, T., Sakai, A., Pickering, H.W.: Atom-Probe Field Ion Microscopy and Its Applications. Advances in Electronics and Electron Physics, Supplement 20. Academic, Boston (1989)Google Scholar
  18. [90T]
    Tsong, T.T.: Atom Probe Field Ion Microscopy. CUP, Cambridge (1990)CrossRefGoogle Scholar
  19. [92L]
    Lam, S.C., Needs, R.J.: Surf. Sci. 277, 359 (1992)ADSCrossRefGoogle Scholar
  20. [96M]
    Miller, M.K., Cerezo, A., Hetherington, M.G., Smith, G.D.W.: Atom Probe Field Ion Microscopy. Clarendon, Oxford (1996)Google Scholar
  21. [09F2]
    Forbes, R.G.: Gas field ionization sources, Chapter 3 in [09O]Google Scholar
  22. [11G]
    Gault, B., Loi, S.T., Araullo-Peters, V.J., Stephenson, L.T., Moody, M.P., Shrestha, S.L., Marceau, R.K.W., Yao, L., Cairney, J.M., Ringer, S.P.: Ultramicroscopy. 111, 1619 (2011)CrossRefGoogle Scholar
  23. [12G]
    Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P.: Atom Probe Microscopy. Springer, New York (2012)CrossRefGoogle Scholar
  24. [14F]
    Forbes, R.G.: Unpublished work (2014)Google Scholar
  25. [14Mil]
    Miller, M.K., Forbes, R.G.: Atom Probe Tomography: The Local Electrode Atom Probe. Springer, New York (2014)Google Scholar
  26. [15F]
    Forbes, R.G., Deane, J.H.B., Fischer A., Mousa, M.S.: Jordan J. Phys. 8, 125 (2015) 125; [arXiv 1504.06134v7]Google Scholar

Copyright information

© Springer-Verlag GmbH Germany 2018

Authors and Affiliations

  1. 1.Advanced Technology InstituteUniversity of SurreyGuildfordUK

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