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Current Challenges in Patent Information Retrieval pp 281–295Cite as

Visual Analysis of Patent Data Through Global Maps and Overlays

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Part of the book series: The Information Retrieval Series ((INRE,volume 37))

Abstract

Visual analytics has been increasingly used to help to better grasp the complexity and evolution of scientific and technological activities over time, across science and technological areas and in organisations. This chapter presents general insights into some important fields of expertise such as mapping, network analysis and visual analytics applied to patent information retrieval and analysis. We also present a new global patent map and overlay technique and illustrative examples of its application. The concluding remarks offer considerations for future patent analysis and visualisation.

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Author information

Authors and Affiliations

  1. Center for Nanotechnology in Society (CNS) – ISBER, University of California Santa Barbara, 2201 North Hall, Santa Barbara, CA, 93106-2150, USA

    Luciano Kay

  2. School of Public Policy, Georgia Institute of Technology, Atlanta GA & Search Technologies, Norcross, GA, USA

    Alan L. Porter

  3. Enterprise Innovation Institute & School of Public Policy, Atlanta, GA, USA

    Jan Youtie

  4. Intelligent Information Services Corporation, Atlanta, GA, USA

    Nils Newman

  5. Ingenio (CSIC-UPV), Universitat Politècnica de València, València, Spain

    Ismael Ràfols

  6. SPRU, University of Sussex, Brighton, UK

    Ismael Ràfols

Authors
  1. Luciano Kay
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  2. Alan L. Porter
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  3. Jan Youtie
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  4. Nils Newman
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  5. Ismael Ràfols
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Corresponding author

Correspondence to Luciano Kay .

Editor information

Editors and Affiliations

  1. Institute for Software Engineering & Interactive Systems, Vienna University of Technology, Vienna, Austria

    Mihai Lupu

  2. Research Platform Responsible Research and Innovation in Academic Practice, University of Vienna, Vienna, Austria

    Katja Mayer

  3. Information & Society Research Division, National Institute of Informatics, Tokyo, Japan

    Noriko Kando

  4. Patinformatics, LLC , Dublin, Ohio, USA

    Anthony J. Trippe

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Kay, L., Porter, A.L., Youtie, J., Newman, N., Ràfols, I. (2017). Visual Analysis of Patent Data Through Global Maps and Overlays. In: Lupu, M., Mayer, K., Kando, N., Trippe, A. (eds) Current Challenges in Patent Information Retrieval. The Information Retrieval Series, vol 37. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-53817-3_10

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  • DOI: https://doi.org/10.1007/978-3-662-53817-3_10

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-53816-6

  • Online ISBN: 978-3-662-53817-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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