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Temporal Characterization of Ultrashort Extreme-Ultraviolet and Soft X-ray Pulses

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Book cover Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 197))

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Abstract

The impressive technological advances in the generation of ultrashort XUV and soft X-ray light pulses have triggered the quest for novel techniques, able to characterize these pulses in the temporal domain. In this chapter we will present and discuss the most important methods for temporal pulse characterization, with particular emphasis on attosecond pulses generated by high-order harmonics and on femtosecond soft X-ray pulses emitted by free electron lasers.

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Acknowledgments

We acknowledge financial support from the European Research Council under the European Community’s Seventh Framework Programme (FP7/2007-2013)/ERC grant agreement n.307964-UDYNI and Contract no. 228334 JRA-INREX (Laserlab Europe III) and from the Italian Ministry of Research and Education (ELI project—ESFRI Roadmap).

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Authors and Affiliations

  1. Istituto di Fotonica e Nanotecnologie - IFN - CNR & Physics Department, Politecnico di Milano, 20133, Milan, Italy

    Michele Devetta, Matteo Negro, Salvatore Stagira & Caterina Vozzi

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  1. Michele Devetta
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  2. Matteo Negro
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  3. Salvatore Stagira
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  4. Caterina Vozzi
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Correspondence to Salvatore Stagira .

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  1. Amplitude Technologies, Evry, France

    Federico Canova

  2. National Research Council, Institute of Photonics and Nanotechnology, Padova, Italy

    Luca Poletto

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Devetta, M., Negro, M., Stagira, S., Vozzi, C. (2015). Temporal Characterization of Ultrashort Extreme-Ultraviolet and Soft X-ray Pulses. In: Canova, F., Poletto, L. (eds) Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources. Springer Series in Optical Sciences, vol 197. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-47443-3_6

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  • DOI: https://doi.org/10.1007/978-3-662-47443-3_6

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