Abstract
High performance SAR (Chaps. 2 and 3) and delta-sigma ADCs (Chaps. 4 and 5) are presented previously. However, an ADC can only perform to its specification (see Chap. 1), if the external connections are adequate [1]. Whenever the ADCs performance is pushed into new dimensions, then the external driver circuitry needs to be reconsidered. The analog inputs and the reference inputs are most critical, because a fast and accurate settling is required at a good noise performance. The ground and supply voltages need to be solid and stable. Particular requirements are discussed in the next Sect. 6.1. The external circuitry is also required for a proper test solution. The principles of the different test methods are explained in Sect. 6.2. The performance needs to be optimized for noise and repeatability. The performance of the production test has to be guaranteed and monitored. A quality flow is therefore described in Sect. 6.3.
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References
Guenter Peltz, Praxis der Analog- und Digitalwandler, Grundlagen, Versuchs- und Anwendungsschaltungen, Elektor Verlag, Aachen 1990.
Frank Ohnhaeuser, Aussteuern der Eingänge von A/D-Wandlern, in the journal Design & Verifikation (Germany), Vol. 10, pp. 22-25, October 2002.
Frank Ohnhaeuser, Driving the inputs of Analog to Digital Converters, in the journal Technologiot (Israel), Vol. 5, pp. 62-64, May 2003.
Bonnie C. Baker, Driving the Analog Inputs of a SAR A/D Converter, Microchip Technology, 2003, URL: http://ww1.microchip.com/downloads/en/AppNotes/00246a.pdf, status of 3/11/2015.
Christopher Peter Hurrell, Bruce Edward Amazeen, Successive approximation analog-to-digital converter with pre-loaded SAR, US Patent 6828927, Analog Devices, 2004, URL: http://www.google.com.ar/patents/US6828927, status of 3/11/2015.
Product datasheet of the OPA365, Texas Instruments, 2009, URL: http://focus.ti.com/lit/ds/symlink/opa365.pdf, status of 3/11/2015.
Frank Ohnhaeuser, Adjusting signal levels in analogue systems, in the journal Electronics Weekly (UK), Vol. 10, pp. 30-31, September 2004.
Frank Ohnhaeuser, Piloter l’entrée de reference d’un CAN a approximations successives, in the journal Electronique (France), Vol 11, pp. 62-64, November 2003.
Application Bulletin, Analog-to-Digital Converter - Grounding Practices Affect System Performance, Burr-Brown, 1994, URL: http://focus.ti.com/lit/an/sbaa052/sbaa052.pdf, status of 3/11/2015.
Don Brockman, Arnold Williams, Ground Rules for High-Speed Circuits, Analog Devices, URL: http://www.analog.com/static/imported-files/application_notes/573185595135053265003392595605308453835483630769AN214.pdf, status of 3/11/2015.
Frank Ohnhäuser, Theory and realization of high-end analog-to-digital converters (ADC) based on the principle of successive approximation (SAR), PhD Thesis at the University of Erlangen-Nürnberg, Erlangen, 2008.
Brad Brannon, Allen Barlow, Aperture Uncertainty and ADC System Performance, Analog Devices, 2006 URL: http://www.analog.com/static/imported-files/application_notes/59756494064912342505447175991257024546937062255921511183854180687755AN501_a.pdf, status of 3/11/2015.
M. Burns, G.W. Roberts, An introduction to mixed-signal IC test and measurement, Oxford University Press, 2001.
Solomon Max, Ramp Testing of ADC Transition Levels using finite Resolution Ramp, in the proceedings of the International Test Conference (ITC), pp.495-501, 2001.
W. Lee, Y. Liao, J. Hsu, Y. Hwang, J. Chen, A high precision ramp generator for low cost ADC test, in the proceedings of the 9th IEEE International Conference on Solid-State and Integrated-Circuits Technology, pp. 2103-2106, 2008.
F. AlegriaP. Arpaia, A. da Cruz Serra, P. Daponte, Performance analysis of an ADC histogram test using small triangular waves, in the IEEE journal of Transactions on Instrumentation and Measurement, Volume 51, Issue 4, pp. 723-729, 2002.
F. Stefani, A. Moschitta, D. Macii, P. Carbone, D. Petri, Fast estimation of ADC nonlinearities using the Sinewave Histogram Test, in the journal Elsevier Measurement, Volume 39, No. 3, pp. 232-237, December 2006.
J.M. Janik, Estimation of A/D Converter Nonlinearities from Complex Spectrum, in the proceedings of the International Workshop for ADC Modeling And Testing (IWADC 2003), pp. 205-208, 2003.
F. Ohnhaeuser, Measuring the DC Accuracy of High Performance Analog-to-Digital Converters (ADCs), in the proceedings of the International Workshop for ADC Modeling and Testing (IWADC 2003), pp. 71-74, 2003.
C. Wegener, M.P. Kennedy, Extending the servo-loop for ADC transition level measurements under dynamic input conditions, in the proceedings of the IEEE Instrumentation and Measurement Technology Conference 2003, Volume 3, pp. 2031-2036, 2001.
Frank Ohnhaeuser, Quality control of high performance analog ICs in mass production, in the journal Electronics Component World (Great Britain), 01/2008.
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Ohnhäuser, F. (2015). External Driver Circuitry and Test of ADCs. In: Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters. Springer Vieweg, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-47020-6_6
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