Gate-Level Masking under a Path-Based Leakage Metric

  • Andrew J. Leiserson
  • Mark E. Marson
  • Megan A. Wachs
Part of the Lecture Notes in Computer Science book series (LNCS, volume 8731)

Abstract

Masking is a popular countermeasure against differential power analysis (DPA) and other side-channel attacks. When designing integrated circuits to resist DPA, masking at the logic gate level has the benefit that it can be implemented without consideration of the high-level function of the circuit. However, the phenomena of glitches and early propagation reduce the effectiveness of many gate-level masking schemes. In this paper we present a new technique for gate-level masking that is free of glitches and early propagation, yet requires only cell-level “don’t touch” constraints. Our technique, which we call LUT-Masked Dual-rail with Precharge Logic (LMDPL), can therefore be implemented in a typical FPGA or standard cell ASIC design flow. LMDPL does not require routing constraints, nor sequencing of the evaluation of individual gates with enables, registers, or latches. We verify our techniques with an AES implementation on an FPGA. Our implementation shows no significant leaks in evaluations using up to 200 million traces.

Keywords

DPA Side-Channel Analysis Masked Logic Dual-Rail Precharge Logic Glitches Early Propagation AES S-box 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  • Andrew J. Leiserson
    • 1
  • Mark E. Marson
    • 1
  • Megan A. Wachs
    • 1
  1. 1.Cryptography Research, Inc.San FranciscoUSA

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