Abstract
This chapter presents the one-test-at-a-time algorithms for finding covering arrays. These algorithms generate the test suite in a greedy manner: test cases are generated one by one, until the coverage requirement is met, while each newly-generated test case covers as many uncovered target combinations as possible. Compared to other approaches, the one-test-at-a-time algorithms are more flexible to deal with various kinds of special test requirements, whoever the strategy brings some limitations on finding smaller test suites.
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Notes
- 1.
For a brief introduction to SAT, see Sect. 6.1.
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Zhang, J., Zhang, Z., Ma, F. (2014). One Test at a Time. In: Automatic Generation of Combinatorial Test Data. SpringerBriefs in Computer Science. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-43429-1_3
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