Abstract
An experimental method is described to determine the depth distribution of characteristic X-rays produced in electron microprobe specimens. The results obtained by measurements on Cu are described and compared with results of other methods given in the literature.
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Schmitz, U., Ryder, P.L., Pitsch, W. (1969). An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_16
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DOI: https://doi.org/10.1007/978-3-662-24778-5_16
Publisher Name: Springer, Berlin, Heidelberg
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