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Specimen Damage by Electron Irradiation

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Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

Abstract

Most of the energy dissipated in energy losses is converted into heat. The rise in specimen temperature can be limited by keeping the illuminated area small.

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  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Strasse 10, D-48149, Münster, Germany

    Professor Dr. Ludwig Reimer

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© 1997 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1997). Specimen Damage by Electron Irradiation. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-14824-2_11

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  • DOI: https://doi.org/10.1007/978-3-662-14824-2_11

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