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Analytical Electron Microscopy

  • Chapter
Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

Abstract

X-ray spectrometers can be coupled to a transmission electron microscope to record x-ray quanta emitted from the specimen. With an energy-dispersive spectrometer, quantitative analysis is possible for elements with atomic numbers above ten.

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  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Professor Dr. Ludwig Reimer

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  1. Professor Dr. Ludwig Reimer
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© 1984 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1984). Analytical Electron Microscopy. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-13553-2_9

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  • DOI: https://doi.org/10.1007/978-3-662-13553-2_9

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