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Introduction

  • Chapter
Book cover Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

Abstract

Although the main concern of this book is transmission electron microscopy, the functions and limits of the other types of electron microscopes are also mentioned in this introductory chapter to show the advantages and disadvantages of their various imaging techniques. Several types of electron microscopes and analysing instruments capable of furnishing an “image” can be distinguished. We now examine these briefly, in turn, without considering the historical sequence in which these instruments were developed. In these background sections, references are restricted to review articles and books.

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References

Emission, Reflection and Mirror Electron Microscopy

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Conferences

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High Voltage Electron Microscopy (for HVEM conferences see [4.47-51]

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Authors and Affiliations

  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Professor Dr. Ludwig Reimer

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  1. Professor Dr. Ludwig Reimer
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© 1984 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1984). Introduction. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-13553-2_1

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  • DOI: https://doi.org/10.1007/978-3-662-13553-2_1

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