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Nanoscale Optical Probes of Ferroelectric Materials

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Nanoscale Characterisation of Ferroelectric Materials

Part of the book series: NanoScience and Technology ((NANO))

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Abstract

Scanning probe microscopy has experienced explosive growth in the last twenty years, beginning with the invention of the scanning tunneling microscope (STM) [1]. The operating principle of the STM involves electron tunneling, but the mechanism by which images are formed is through raster scanning, controlled by a ferroelectric (and piezoelectric) crystal. Soon after the development of the atomic force microscope, (AFM) [2], it was realized that ferroelectrics themselves could benefit from the use of scanning probes. Saurenbach and Terris [3] reported the first observations of domain structures in ferroelectrics using AFM. Since then there have been hundreds of subsequent reports. Large contrast and distinct phase difference make the piezoelectric mode of scanning force microscopy [4] a convenient technique to distinguish areas with different signs of ferroelectric polarization, provided that the piezoelectric response is large. Scanning measurements of linear [5]and nonlinear capacitance [6]can reveal the spatial distribution of dielectric properties, as can scanning microwave microscopy [7]. A review of AFM-based scanning probe techniques is found in Chap. 2.

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Authors
  1. J. Levy
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  2. O. Tikhomirov
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Editors and Affiliations

  1. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120, Halle (Saale), Germany

    Marin Alexe

  2. Department of Materials Science and Engineering, North Carolina State University, Campus Box 7920, 27695, Raleigh, NC, USA

    Alexei Gruverman

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Levy, J., Tikhomirov, O. (2004). Nanoscale Optical Probes of Ferroelectric Materials. In: Alexe, M., Gruverman, A. (eds) Nanoscale Characterisation of Ferroelectric Materials. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-08901-9_4

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  • DOI: https://doi.org/10.1007/978-3-662-08901-9_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-05844-8

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