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Diffraction from Periodic Structures

  • Harald Ibach
  • Hans Lüth
Part of the Advanced Texts in Physics book series (ADTP)

Abstract

A direct imaging of atomic structures is nowadays possible using the high-resolution electron microscope, the field ion microscope, or the tunneling microscope. Nonetheless, when one wishes to determine an unknown structure, or make exact measurements of structural parameters, it is necessary to rely on diffraction experiments. The greater information content of such measurements lies in the fact that the diffraction process is optimally sensitive to the periodic nature of the solid’s atomic structure. Direct imaging techniques, on the other hand, are ideal for investigating point defects, dislocations, and steps, and are also used to study surfaces and interfaces. In other words, they are particularly useful for studying features that represent a disruption of the periodicity.

Keywords

Periodic Structure Lattice Plane Diffraction Experiment Reciprocal Lattice Bragg Reflection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Further Reading

  1. Burzlaff, H., Thiele, G. (eds.): Kristallographie — Grundlagen und Anwendungen (Thieme, Stuttgart 1977), insbesondere: Burzlaff, H, Zimmermann, H.: “Symmetrielehre”, Bd. IGoogle Scholar
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  3. Heine, V.: Group Theory in Quantum Mechanics ( Pergamon, London 1960 )zbMATHGoogle Scholar
  4. Koster, G.F., Dimmock, J.O., Wheeler, R.G., Statz, H.: Properties of the 42 Point Groups ( MIT Press, Cambridge, MA 1963 )Google Scholar
  5. Streitwolf, H.: Gruppentheorie in der Festkörperphysik ( Akademische Verlagsges., Leipzig 1967 )zbMATHGoogle Scholar
  6. Tinkham, M.: Group Theory and Quantum Mechanics ( McGraw-Hill, New York 1964 )zbMATHGoogle Scholar
  7. Vainshtein, B.K.: Fundamentals of Crystals: Symmetry and Methods of Structural Crystallography, Springer Ser. Modern Crystallography, Vol. 1 ( Springer, Berlin Heidelberg 1994 )Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2003

Authors and Affiliations

  • Harald Ibach
    • 1
    • 2
  • Hans Lüth
    • 1
    • 2
  1. 1.Institut für Schichten und GrenzflächenForschungszentrum Jülich GmbHJülichGermany
  2. 2.Rheinisch-Westfälische Technische HochschuleAachenGermany

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