Abstract
Electron spectroscopy probes the electronic structure of the surface through analysis of the energy spectra of the secondary electrons emitted from the sample. The secondary electrons are created generally by bombarding the surface with electrons or photons (other particles are also used (for example, ions or atoms), but seldom). The typical energies of secondary electrons analyzed in surface electron spectroscopy belong to the range 5–2000 eV. The surface sensitivity of electron spectroscopy stems from the fact that electrons with energies in that range are strongly scattered in solids. Figure 5.1 shows a plot of experimental values of the electron inelastic mean free path versus the electron kinetic energy. Though the data are energy and material dependent the magnitude of the inelastic mean free path in the whole energy range is of the order of several dozens of Å and in the favorable energy interval (~20–200 eV) is less than 10 Å.
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References
Further Reading
D.P. Woodruff, T.A. Delchar: Modern Techniques of Surface Science, 2nd ed. (Cambridge University Press, Cambridge 1999) chapter 3 (About applications of AES and PES)
D. Briggs, M.P. Seach (Ed.): Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (John Wiley, Chichester 1983) (about practical aspects of AES and XPS, including quantitative chemical analysis in detail)
C. Kittel: Introduction to Solid State Physics, 7th ed. (John Wiley, New York 1996) Chapter 10 (about plasma oscillations in solids, derivation of expressions for bulk and surface plasmon energies)
H. Ibach: Electron Energy Loss Spectrometers (Springer, Berlin, Heidelberg 1991) (about the HREELS set-up in great detail)
H. Lüth: Surfaces and Interfaces of Solid Materials, 3rd ed. (Springer, Berlin, Heidelberg 1995) Chapter 4 (on the dielectric theory of inelastic electron scattering)
S. Hüfner: Photoelectron Spectroscopy: Principles and Applications, 2nd ed. (Springer, Berlin, Heidelberg 1996)
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Oura, K., Katayama, M., Zotov, A.V., Lifshits, V.G., Saranin, A.A. (2003). Surface Analysis II. Electron Spectroscopy Methods. In: Surface Science. Advanced Texts in Physics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-05179-5_5
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DOI: https://doi.org/10.1007/978-3-662-05179-5_5
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