This chapter explains the physical basis for three sources of broadening of diffraction peaks from crystalline materials:
-
small sizes of crystallites,
-
distributions of strains within inclividival crystailltes, or differences in strains between crystallites,
-
the diffractometer.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
Further Reading
The contents of the following are described in the Bibliography.
Leonid V. Azároff: Elements of X-Ray Crystallography (McGraw—Hill, New York 1968), reprinted by TechBooks, Fairfax, VA.
Bernard D. Cullity: Elements of X-Ray Diffraction (Addison—Wesley, Reading, MA 1978).
Harold P. Klug and Leroy E. Alexander: X-Ray Diffraction Procedures (Wiley—Interscience, New York 1974).
I. C. Noyan and J. B. Cohen: Residual Stress (Springer—Verlag, New York 1987).
L. H. Schwartz and J. B. Cohen: Diffraction from Materials (Springer—Verlag, Berlin 1987).
B. E. Warren: X-Ray Diffraction (Dover, Mineola, NY 1990)
Chapter 8 title figure of (400)fcc diffraction from a nanocrystalline iron alloy
(Mo Ka radiation) .
8.1 H. P. Klug and L. E. Alexander: X-Ray Diffraction Procedures (WileyInterscience, New York 1974) pp. 687–692.
8.2 H. P. Klug and L. E. Alexander: X-Ray Diffraction Procedures (WileyInterscience, New York 1974) pp. 655–665.
8.3 B. E. Warren: X-Ray Diffraction (Dover, New York, 1990) pp. 251–275.
8.4 Warren and Averbach J. Appl. Phys. 21, (1950) 595.
8.4 Warren and Averbach J. Appl. Phys. 23, 497 (1952).
8.4a B. E. Warren: ‘X-Ray Studies of Deformed Metals’, Prog. Metal. Phys. 8, 147 (1959).
8.4b B. E. Warren: X-Ray Diffraction (Dover, New York, 1990) pp. 251–275.
8.5 C. E. Krill, R. Haberkorn and R. Birringer: ‘Specification of microstructure and characterization by scattering techniques’. In: Handbook of Nanostructured Materials and Nanotechnology, Vol. 2: Spectroscopy and Theory, ed. by H. S. Nalwa (Academic Press, San Diego, 2000) pp. 155–211.
8.6 Figure reprinted courtesy of C. E. Krill and R. Birringer, unpublished. The methods are described in C. E. Krill and R. Birringer, Philos. Mag. A 77, 621 (1998).
8.7 H. Frase: Vibrational and Magnetic Properties of Mechanically Attrited Ni3Fe Nanocrystals. Ph.D. Thesis, California lnstitute of Technology, California (1998).
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2002 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Fultz, B., Howe, J.M. (2002). Diffraction Lineshapes. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04901-3_8
Download citation
DOI: https://doi.org/10.1007/978-3-662-04901-3_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-04903-7
Online ISBN: 978-3-662-04901-3
eBook Packages: Springer Book Archive