Summary
It is difficult to determine the atomic arrangement of boron, carbon, and oxygen in solid clusters and oxides because of their low atomic numbers. However, it is believed that high-resolution images should provide some information about disordering, ordering, and doping atomic positions in these materials. In the present work, information about disordering and ordering atomic positions in YB56 and HgT1Ba2CuO x was obtained from digital high-resolution images. Residual indices and difference images were calculated for structure analysis. The present work indicates that atomic detection with residual indices and difference images is very useful for evaluating local structure in ceramic materials containing light elements such as boron and oxygen atoms.
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References
S.M. Richards, J.S. Kasper: Acta Cryst. 25, 237 (1969)
T. Tanaka, Y. Ishizawa, J. Wong, Z.U. Rek, M. Rowen, F. Schafers, B.R. Muller: Jpn. J. Appl. Phys. Series 10, 110 (1994)
I. Higashi, K. Kobayashi, T. Tanaka, Y. Ishizawa: J. Solid State Chem. 133, 16 (1997)
G.A. Slack, D.W. Oliver, G.D. Brower, J.D. Young: J. Phys. Chem. Solids 38, 45 (1977)
C.L. Perkins, M. Trenary, T. Tanaka: J. Solid State Chem. 133, 31 (1996)
U. Kuhlmann, H. Werheit, T. Tanaka, Y. Ishizawa: Proc. Int. Symp. on Boron, Borides and Related Compounds 12, 69 (1996)
S.N. Putilin, E.V. Antipov, O. Chmaissem, M. Marezio: Nature 362, 226 (1993)
A. Schilling, M. Cantoni, J.D. Guo, H.R. Ott: Nature 363, 56 (1993)
M. Hirabayashi, K. Tokiwa, M. Tokumoto, H. Ihara: Jpn. J. Appl. Phys. 32, L1206 (1993)
S. Nakajima, M. Kikuchi, T. Atou, M. Kikuchi, Y. Syono: Jpn. J. Appl. Phys. 33, 1863 (1994)
P.G. Radaelli, M. Marezio, M. Perroux, S. de Brion, J.L. Tholence, Q. Huang, A. Santoro: Science 265, 380 (1994)
P.G. Radaelli, M. Marezio, J.L. Tholence, S. de Brion, S. Loureiro, A. Santoro, Q. Huang, J.J. Capponi, M. Alario Franco, C. Chaillout: Physica C 235–240, 925 (1994)
Y.X. Jia, C.S. Lee, A. Zettl: Physica C 234, 24 (1994)
I. Bryntse: Physica C 226, 184 (1994)
S. Nakajima, T. Oku, K. Nagase, Y. Syono: Physica C 262, 1 (1996)
T. Oku, A. Carlsson, L.R. Wallenberg, J.-O. Malm, J.-O. Bovin, I. Higashi, T. Tanaka, Y. Ishizawa: J. Solid State Chem. 135: 182 (1998)
T. Oku, J.-O. Bovin: Phil. Mag. 79, 821 (1999)
T. Oku, S. Nakajima: J. Mater. Res. 13, 1136 (1998)
D. Shindo, T. Oku, J. Kudoh, T. Oikawa: Ultramicroscopy 54, 221 (1994)
T. Oku, D. Shindo, S. Nakajima, A. Tokiwa, M. Kikuchi, Y. Syono, K. Hiraga: Studies of High Temperature Superconductors 15, 103 (Nova Science Pub. 1995 )
M. Pan, P.A. Crozier: Ultramicroscopy 52, 487 (1993)
S. Hovmöller, A. Sjögren, G. Farrants, M. Sundberg, B.-O. Marinder: Nature 331, 238 (1984)
J.M. Cowley: Diffraction Physics, 2nd revised edn. ( Amsterdam, North-Holland 1981 )
A.R. Smith, L. Eyring: Ultramicroscopy 8, 65 (1982)
A. Tokiwa, T. Oku, M. Nagoshi, M. Kikuchi, K. Hiraga, Y. Syono: Physica C 161, 459 (1989)
A. Tokiwa, T. Oku, M. Nagoshi, D. Shindo, M. Kikuchi, T. Oikawa, K. Hiraga, Y. Syono: Physica C 172, 155 (1990)
S. Nakajima, M. Kikuchi, T. Oku, N. Kobayashi, T. Suzuki, K. Nagase, K. Hiraga, Y. Muto, Y. Syono: Physica C 160, 458 (1989)
S. Nakajima, T. Oku, R. Suzuki, M. Kikuchi, K. Hiraga, Y. Syono: Physica C 214, 80 (1993)
G. Möbus, M. Rühle: Ultramicroscopy 56, 54 (1994)
D. Hofmann, F. Ernst: Ultramicroscopy 53, 205 (1994)
W.E. King, G.H. Campbell: Ultramicroscopy 56, 46 (1994)
T. Oku: J. Ceram. Soc. Jpn. 109, S17 (2001)
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Oku, T. (2002). Nanostructural Characterization of Inorganic Materials by High-Resolution Electron Microscopy. In: Kawazoe, Y., Kondow, T., Ohno, K. (eds) Clusters and Nanomaterials. Springer Series in CLUSTER PHYSICS. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04812-2_9
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DOI: https://doi.org/10.1007/978-3-662-04812-2_9
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