Abstract
Electron beam excited optical photons (Ehv=6−0.7 eV) can be detected and used for cathodoluminescence (CL) microscopy and spatially resolved CL spectroscopy by attaching a light collector and monochromator to an electron probemicro-analyser (EPMA) or a scanning electron microscope (SEM). Colour CL images measured using an EPMA were first reported by Long and Agrell (1965) when the EMPA technique was originally applied to mineralogy. In this initial approach the CL emission was excited with a stationary beam and recorded on a colour photographic plate through the eyepiece of the optical microscope attached to the EPMA. Over the past 30 years, there have been significant improvements in CL measurement instrumentation and analysis techniques. High resolution CL spectra as well as CL digital images with submicron spatial resolution are now measured using high sensitivity UV-VIS-NIR photon detectors and a scanned electron probe with a well defined energy, diameter and current. As a result of these developments CL microscopy and microanalysis are now routinely used for the analysis of structural defects and impurities in a wide range of materials.
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Remond, G., Phillips, M.R., Roques-Carmes, C. (2000). Importance of Instrumental and Experimental Factors on the Interpretation of Cathodoluminescence Data from Wide Band Gap Materials. In: Pagel, M., Barbin, V., Blanc, P., Ohnenstetter, D. (eds) Cathodoluminescence in Geosciences. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04086-7_4
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DOI: https://doi.org/10.1007/978-3-662-04086-7_4
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