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Photoelectron Diffraction

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Photoelectron Spectroscopy

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 82))

Abstract

So far in this volume, we have neglected a seemingly obvious effect in PES, namely the scattering of the photoexcited electron on its way through the crystal to the surface, by the crystal potential. This is a straightforward scattering problem leading to intensity modulations as a function of electron wavelength and/or crystal orientation. Such intensity modulations have indeed been observed and the method of measuring PES in order to bring out most clearly the scattering features of the final-state electron intensity is called PhotoElectron Diffraction (PED).

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References

  1. T.M. Hayers, J.B. Boyce: Solid State Physics 37, 173 ( Academic, New York 1982 )

    Google Scholar 

  2. D.C. Koningsberger, R. Prins (eds.): Principles, Applications, Techniques of EXAFS, SEXAFS and XANES ( Wiley, New York 1988 )

    Google Scholar 

  3. For a recent comprehensive treatment of NEXAFS spectroscopy see J. Stöhr: NEXAFS Spectroscopy, Springer Ser. Surf. Sci., Vol.25 (Springer, Berlin, Heidelberg 1992 ); NEXAFS means that the EXAFS experiment is performed only near the absorption threshold

    Google Scholar 

  4. J.J. Rehr, J. Mustre de Leon, S.I. Zabinsky, R.C. Albers: J. Am. Chem. Soc. 113, 5135 (1991)

    Article  Google Scholar 

  5. L. Tröger, T. Yokoyama, D. Arvanitis, T. Lederer, M. Tischer, K. Baberschke: Phys. Rev. B 49, 888 (1994)

    Article  ADS  Google Scholar 

  6. C.S. Fadley: Progress in Surf. Sci. 16, 275 (1984)

    Google Scholar 

  7. J.J. Barton, S.W. Rohey, D.A. Shirley: Phys. Rev. B 34, 778 (1986)

    Article  ADS  Google Scholar 

  8. C.S. Fadley: Phys. Scr. T 17, 39 (1987)

    Article  ADS  Google Scholar 

  9. C.S. Fadley: In Synchrotron Radiation Research: Advances in Surface Science, ed. by R.C. Bachrach ( Plenum, New York 1989 )

    Google Scholar 

  10. W.F. Egelhoff, Jr.: Crit. Rev. Solid State Mat. Sci. 16, 213 (1990); Solid State Materials Sciences 16, 213 (1990)

    Article  Google Scholar 

  11. L. Fonda: Phys. Stat. Sol. (b) 182, 9 (1994)

    Article  ADS  Google Scholar 

  12. S.A. Chambers: In Advances in Physics ed. by S. Doniach ( Taylor and Francis, London 1991 )

    Google Scholar 

  13. W.L. Schaich: Phys. Rev. B8, 4028 (1973)

    Article  ADS  Google Scholar 

  14. B. Lengeler: In Elektronenspektroskopische Methoden an Festkörpern und Oberflächen Vols.I and II (Kernforschungsanlage, Jülich 1980)

    Google Scholar 

  15. J. Stöhr, R. Jäger, S. Brennan: Surf. Sci. 117, 503 (1982)

    Article  ADS  Google Scholar 

  16. D.v.d.Marel, G.A. Sawatzky, R. Zeller, F.U. Hillebrecht, J.C. Fuggle: Solid State Commun. 50, 47 (1984)

    Article  ADS  Google Scholar 

  17. W. Speier, T.M. Hayes, J.W. Allen, J.B. Boyce, J.C. Fuggle, M. Campagna: Phys. Rev. Lett. 55, 1693 (1985)

    Article  ADS  Google Scholar 

  18. S. Anderson: Surf. Sci. 15, 231 (1969)

    Article  Google Scholar 

  19. D.W. Jepson, P.M. Marcus, F. Jona: Phys. Rev. B5, 3933 (1972)

    Article  ADS  Google Scholar 

  20. Y. Jugnet, G. Grenet, N.S. Prakash, Tran Minh Due, H.C. Poon: Phys. Rev. B 38, 5281 (1988)

    Article  Google Scholar 

  21. M.L. Xu, J.J. Barton, M.A. van Hove: Phys. Rev. B39, 8275 (1989)

    Article  ADS  Google Scholar 

  22. W.F. Egelhoff, Jr.: Phys. Rev. Lett. 59, 559 (1987)

    Article  ADS  Google Scholar 

  23. J. Osterwalder, T. Greber, S. Hüfner, L. Schlapbach: Phys. Rev. B 41, 12495 (1990)

    Article  ADS  Google Scholar 

  24. S. Hüfner, J. Osterwalder, T. Greber, L. Schlapbach: Phys. Rev. B 42, 7350 (1990)

    Article  ADS  Google Scholar 

  25. J. Osterwalder, A. Stuck, Th. Greber, L. Schlapbach, S. Hüfner: Unpublished (Université de Fribourg)

    Google Scholar 

  26. R.S. Saiki, G.S. Herman, M. Jamada, J. Osterwalder, C.S. Fadley: Phys. Rev. Lett. 63, 283 (1989)

    Article  ADS  Google Scholar 

  27. K.U. Weiss, R. Dippel, K.M. Schindler, P. Gardner, V. Fritzsche, A.M. Bradshaw, A.L.D. Kilcoyne, D.P. Woodruff: Phys. Rev. Lett. 69, 3196 (1992)

    Article  ADS  Google Scholar 

  28. A. Santoni, L.J. Terminello, F.J. Himpsel, T. Takahashi: Applied Physics A 52, 299 (1991)

    Article  Google Scholar 

  29. J. Osterwalder, A. Stuck, T. Greber, P. Aebi, L. Schlapbach, S. Hüfner: Proc. 10th VUV Coni., ed. by F.J. Wullenmier, Y. Petroff, N. Nenner ( World Scientific, Singapore 1993 ) p. 475

    Google Scholar 

  30. P. Aebi, J. Osterwalder, R. Fasel, D. Naumovic, L. Schlapbach: Surf. Sci. 307–309, 917 (1994); the Fermi surface of Bi2Sr2CaCu2O8 has been determined by this method by P. Aebi, J. Osterwalder, P. Schwaller, L. Schlapbach, M. Shimoda, T. Mochiku, K. Kadowaki: Phys. Rev. Lett. 72, 2757 (1994)

    Google Scholar 

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Authors and Affiliations

  1. Fachbereich Physik, Universität des Saarlandes, D-66041, Saarbrücken, Germany

    Professor Dr. Stefan Hüfner

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  1. Professor Dr. Stefan Hüfner
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© 1995 Springer-Verlag Berlin Heidelberg

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Hüfner, S. (1995). Photoelectron Diffraction. In: Photoelectron Spectroscopy. Springer Series in Solid-State Sciences, vol 82. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-03150-6_11

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  • DOI: https://doi.org/10.1007/978-3-662-03150-6_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-03152-0

  • Online ISBN: 978-3-662-03150-6

  • eBook Packages: Springer Book Archive

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