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Sample Preparations

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Compact Introduction to Electron Microscopy

Part of the book series: essentials ((ESSENT))

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Abstract

Starting with an overview on the main lines of preparation of compact materials for the different microscopy techniques, etching techniques including the focused ion beam technique and (cryo)ultramicrotomy are outlined with some possibilities for spatial structural analysis (3D analysis). Chemical and physical sample treatments are mentioned for an often necessary improvement of the contrast of the structures of interest.

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References

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Authors and Affiliations

  1. Institute of Physics, Martin-Luther-University Halle - Wittenberg, Halle (Saale), Germany

    Goerg H. Michler

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  1. Goerg H. Michler
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© 2023 The Author(s), under exclusive license to Springer Fachmedien Wiesbaden GmbH, part of Springer Nature

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Michler, G.H. (2023). Sample Preparations. In: Compact Introduction to Electron Microscopy. essentials. Springer, Wiesbaden. https://doi.org/10.1007/978-3-658-37364-1_3

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