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DGU pp 142-165 | Cite as

Bayesian Reliability Demonstration

  • G. J. Schick
  • T. M. Drnas
Conference paper
Part of the Proceedings in Operations Research book series (ORP, volume 1971)

Abstract

A Bayesian approach to reliability demonstration testing is described and differences between the Bayesian viewpoint and the commonly employed classical approach are highlighted. A procedure for selecting a specific inverted gamma probability density to characterize the prior distribution of the MTBF of electronic hardware is developed and a table of Bayesian demonstration plans for a practical range of input parameters is provided. In addition, procedures for implementation of the plans and two illustrative examples are given. Finally, two commonly employed classical plans are compared to a Bayesian plan illustrating the efficiency of the latter in terms of demonstration test time requirements.

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Copyright information

© Physica-Verlag, Rudolf Liebing KG, Würzburg 1972

Authors and Affiliations

  • G. J. Schick
    • 1
  • T. M. Drnas
    • 2
  1. 1.Los AngelesUSA
  2. 2.Culver CityUSA

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