Abstract
Layered materials [6.1] exhibit many properties which make them special with regards to STM studies and in scanning probe microscopy in general. Thus an entire chapter is devoted to STM investigations of layered materials, although, depending on the electrical conductivity of the layered materials, these investigations could also have been included in the chapters on metals or semiconductors. In contrast, insulating layered materials cannot be studied by STM but only by its relative, atomic force microscopy (AFM). Such investigations are reported in the chapter entitled “Scanning Force Microscopy” in the second volume on “Scanning Tunneling Microscopy”.
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References
For a comprehensive overview of layered materials see:Physics and Chemistry of Materials with Layered Structures, Vol. 1–6 (Reidel, Dordrecht)
G. Binnig, H. Fuchs, Ch. Gerber, H. Rohrer, E. Stoll, E. Tosatti: Europhys. Lett. 1, 31 (1986)
Sangil Park, C.F. Quate: Appi. Phys. Lett. 48, 112 (1986)
LP. Batra, N. Garcia, H. Rohrer, H. Salemink, E. Stoll, S. Ciraci: Surf. Sci. 181, 126 (1987)
D. Tomanek, S.G. Louie, H.J. Mamin, D.W. Abraham, R.E. Thomson, E. Ganz, J. Clarke: Phys. Rev. B 35, 7790 (1987)
D. Tomanek, S.G. Louie: Phys. Rev. B37, 8327 (1988)
J. Tersoff: Phys. Rev. Lett. 57, 440 (1986)
J. Tersoff, D.R. Hamann: Phys. Rev. B31, 805 (1985)
A. Selloni, P. Carnevali, E. Tosatti, C.D. Chen: Phys. Rev. B31, 2602 (1985)
B. Reihl, J.K. Gimzewski, J.M. Nicholls, E. Tosatti: Phys. Rev. B33, 5770 (1986)
H. Fuchs, E. Tosatti: Europhys. Lett. 3, 745 (1987)
J.M. Soler, A.M. Baro, N. Garcia, H. Rohrer: Phys. Rev. Lett. 57, 444 (1986)
S.L. Tang, J. Bokor, R.H. Storz: Appi. Phys. Lett. 52, 188 (1988)
C.M. Mate, R. Erlandsson, G.M. McClelland, S. Chiang: Surf. Sci. 208, 473 (1989)
H.J. Mamin, E. Ganz, D.W. Abraham, R.E. Thomson, J. Clarke: Phys. Rev. B34, 9015 (1986)
J.B. Pethica: Phys. Rev. Lett. 57, 3235 (1986)
D.P.E. Smith, G. Binnig, C.F. Quate: Appi. Phys. Lett. 49, 1166 (1986)
S. Ciraci, LP. Batra: Phys. Rev. B36, 6194 (1987)
E. Tekman, S. Ciraci: Phys. Scripta 38, 486 (1988)
E. Tekman, S. Ciraci: Phys. Rev. B40, 10286 (1989)
S. Ciraci, A. Baratoff, LP. Batra: Phys. Rev. B41, 2763 (1990)
S. Ciraci, E. Tekman: Phys. Rev. B40, 11969 (1989)
C.J. Chen: Mod. Phys. Lett. B5, 107 (1991)
H.A. Mizes, Sangil Park, W.A. Harrison: Phys. Rev. B36, 4491 (1987)
T.R. Albrecht, H.A. Mizes, J. Nogami, Sangil Park, C.F. Quate: Appi. Phys. Lett. 52, 362 (1988)
K. Kobayashi, M. Tsukada: J. Vac. Sci. Technol. A8, 170 (1990)
G. Binnig: Specul. Sci. Technol. 10, 345 (1987)
A. Bryant, D.P.E. Smith, G. Binnig, W.A. Harrison, C.F. Quate: Appi. Phys. Lett. 49, 936 (1986)
H.A. Mizes, W.A. Harrison: J. Vac. Sci. Technol. A6, 300 (1988)
M.R. Soto: J. Microsc. 152, 779 (1988)
M.R. Soto: Surf. Sci. 225, 190 (1990)
H.A. Mizes, J.S. Foster: Science 244, 559 (1989)
J.P. Rabe, M. Sano, D. Batchelder, A.A. Kalatchev: J. Microsc. 152, 573 (1988)
D. Anselmetti: “Rastertunnelmikroskopie an Synthetischen Metallen”; Ph.D. Thesis, University of Basel (1990)
R. Coratger, A. Claverie, F. Ajustron, J. Beauvillain: Surf. Sci. 227, 7 (1990)
D.W. Abraham, K. Sattler, E. Ganz, H.J. Mamin, R.E. Thomson, J. Clarke: Appi. Phys. Lett. 49, 853 (1986)
A.M. Barò, A. Bartolome, L. Vazquez, N. Garcia, R. Reifenberger, E. Choi, R.P. Andres: Appi. Phys. Lett. 51, 1594 (1987)
E. Ganz, K. Sattler, J. Clarke: Phys. Rev. Lett. 60, 1856 (1988)
E. Ganz, K. Sattler, J. Clarke: J. Vac. Sci. Technol. A6, 419 (1988)
E. Ganz, K. Sattler, J. Clarke: Surf. Sci. 219, 33 (1989)
A. Humbert, R. Pierrisnard, S. Sangay, C. Chapon, C.R. Henry, C. Claeys: Europhys. Lett. 10, 533 (1989)
M.S. Dresselhaus, G. Dresselhaus: Adv. Phys. 30, 139 (1981)
P. Pfluger, H.-J. Güntherodt: In Festkörperprobleme (Advances in Solid State Physics) Vol. XXI, ed. by J. Treusch (Vieweg, Braunschweig 1981) pp. 271
M.S. Dresselhaus: Synth. Met. 12, 5 (1985)
W. Rüdorff: Adv. Inorg. Chem. 1, 223 (1959)
J. Schneir, R. Sonnenfeld, P.K. Hansma, J. Tersoff: Phys. Rev. B34, 4979 (1986)
D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt: Phys. Rev. B39, 11135 (1989)
D. Anselmetti, R. Wiesendanger, V. Geiser, H.R. Hidber, H.-J. Güntherodt: J. Microsc. 152, 509 (1988)
R. Wiesendanger, D. Anselmetti, V. Geiser, H.R. Hidber, H.-J. Güntherodt: Synth. Met. 34, 175 (1989)
S.P. Kelty, C.M. Lieber: Phys. Rev. B40, 5856 (1989)
S.P. Kelty, C.M. Lieber: J. Phys. Chem. 93, 5983 (1989)
D. Anselmetti, V. Geiser, G. Overney, R. Wiesendanger, H.-J. Güntherodt: Phys. Rev. B42, 1848 (1990)
D. Anselmetti, V. Geiser, D. Brodbeck, G. Overney, R. Wiesendanger, H.-J. Güntherodt: Synth. Met. 38, 157 (1990)
S. Gauthier, S. Rousset, J. Klein, W. Sacks, M. Berlin: J. Vac. Sci. Technol. A6, 360 (1988)
S. Gauthier, S. Rousset, J. Klein, W. Sacks, M. Berlin: In The Structure of Surfaces, ed. by J.F. van der Veen, M.A. Van Hove, Springer Ser. Surf. Sci., Vol. 11 (Springer, Berlin, Heidelberg 1988) pp. 71
D.M. Hwang, N.W. Parker, M. Utlaut, A.V. Crewe: Phys. Rev. B27, 1458 (1983)
C.H. Oik, J. Heremans, M.S. Dresselhaus, J.S. Speck, J.T. Nicholls: Phys. Rev. B42, 7524 (1990)
M. Tanaka, W. Mizutani, T. Nakashizu, N. Morita, S Yamazaki, H. Bando, M. Ono, K. Kajimura: J. Microsc. 152, 183 (1988)
A. Selloni, C.D. Chen, E. Tosatti: Phys. Scripta 38, 297 (1988)
X. Qin, G. Kirczenow: Phys. Rev. B39, 6245 (1989)
X. Qin, G. Kirczenow: Phys. Rev. B41, 4976 (1990)
M. Lagues, J.E. Fischer, D. Marchand, C. Fretigny: Solid State Commun. 67, 1011 (1988)
D. Marchand, C. Fretigny, N. Lecomte, M. Lagues: Synth. Met. 23, 165 (1988)
D. Tomanek, G. Overney, H. Miyazaki, S.D. Mahanti, H.-J. Güntherodt: Phys. Rev. Lett. 63, 876 (1989)
J.A. Wilson, A.D. Yoffe: Adv. Phys. 18, 193 (1969)
H. Tokumoto, H. Bando, W. Mizutani, M. Okano, M. Ono, H. Murakami, S. Okayama, Y. Ono, K. Watanabe, S. Wakiyama, F. Sakai, K. Endo, K. Kajimura: Jpn. J. Appi. Phys. 25, L621 (1986)
K. Kajimura, H. Bando, K. Endo, W. Mizutani,-H. Murakami, M. Okano, S. Okayama, M. Ono, Y. Ono, H. Tokumoto, F. Sakai, K. Watanabe, S. Wakiyama: Surf. Sci. 181, 165 (1987)
H. Bando, H. Tokumoto, W. Mizutani, K. Watanabe, M. Okano, M. Ono, H. Murakami, S. Okayama, Y. Ono, S. Wakiyama, F. Sakai, K. Endo, K. Kajimura: Jpn. J. Appi. Phys. 26, L41 (1987)
R.V. Coleman, B. Giambattista, A. Johnson, W.W. McNairy, G. Slough, P.K. Hansma, B. Drake: J. Vac. Sci. Technol. A6, 338 (1988).
D.C. Dahn, M.O. Watanabe, B.L. Blackford, M.H. Jericho: J. Appi. Phys. 63, 315 (1988)
M. Watanabe, D.C. Dahn, B. Blackford, M.H. Jericho: J. Microsc. 152, 175 (1988)
G.W. Stupian, M.S. Leung: Appi. Phys. Lett. 51, 1560 (1987)
M. Weimer, J. Kramar, C. Bai, J.D. Baldeschwieler: Phys. Rev. B37, 4292 (1988)
D. Sarid, T.D. Henson, N.R. Armstrong, L.S. Bell: Appi. Phys. Lett. 52, 2252 (1988)
T.D. Henson, D. Sarid, L.S. Bell: J. Microsc. 152, 467 (1988)
T. Ichinokawa, T. Ichinose, M. Tohyama, H. Itoh: J. Vac. Sci. Technol A8, 500 (1990)
S. Akari, M. Stachel, H. Birk, E. Schreck, M. Lux, K. Dransfeld: J. Microsc. 152, 521 (1988)
S.L. Tang, R.V. Kasowski, B.A. Parkinson: Phys. Rev. B39, 9987 (1989)
H. Bando, N. Morita, H. Tokumoto, W. Mizutani, K. Watanabe, A. Homma, S. Wakiyama, M. Shigeno, K. Endo, K. Kajimura: J. Vac. Sci. Technol A6, 344 (1988)
T.R. Albrecht: “Advances in Atomic Force Microscopy and Scanning Tunneling Microscopy”: Ph.D. Thesis, Stanford University (1989)
J.A. Wilson, F.J. DiSalvo, S. Mahajan: Adv. Phys. 24, 117 (1975)
G. Grüner: Rev. Mod. Phys. 60, 1129 (1988)
R.E. Peierls: Quantum Theory of Solids (Oxford University Press, Oxford 1955) pp. 108
R.V. Coleman, B. Drake, P.K. Hansma, G. Slough: Phys. Rev. Lett. 55, 394 (1985)
R.V. Coleman, B. Giambattista, P.K. Hansma, A. Johnson, W.W. McNairy, C.G. Slough: Adv. Phys. 37, 559 (1988)
R.V. Coleman, B. Drake, B. Giambattista, A. Johnson, P.K. Hansma, W.W. McNairy, G. Slough: Phys. Scripta 38, 235 (1988)
C.G. Slough, W.W. McNairy, R.V. Coleman, B. Drake, P.K. Hansma, Phys. Rev. B34, 994 (1986)
R.V. Coleman, W.W. McNairy, C.G. Slough, P.K. Hansma, B. Drake: Surf. Sci. 181, 112 (1987)
B. Giambattista, A. Johnson, R.V. Coleman, B. Drake, P.K. Hansma: Phys. Rev. B37, 2741, 1958
R.E. Thomson, U. Walter, E. Ganz, J. Clarke, A. Zettl, P. Rauch, F.J. DiSalvo: Phys. Rev. B38, 10734 (1988)
R.E. Thomson, U. Walter, E. Ganz, P. Rauch, A. Zettl, J. Clarke: J. Microsc. 152, 771 (1988)
G. Gammie, S. Skala, J.S. Hubacek, R. Brockenbrough, W.G. Lyons, J.R. Tucker, J.W. Lyding: J. Microsc. 152, 497 (1988)
X.L. Wu, C.M. Lieber: Science 243, 1703 (1989)
X.L. Wu, C.M. Lieber: Phys. Rev. Lett. 64, 1150 (1990)
E. Meyer, D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt, F. Lévy, H. Berger: Europhys. Lett. 9, 695 (1989)
E. Meyer, R. Wiesendanger, D. Anselmetti, H.R. Hidber, H.-J. Güntherodt, F. Lévy, H. Berger: J. Vac. Sci. Technol. A8, 495 (1990)
C.G. Slough, B. Giambattista, A. Johnson, W.W. McNairy, C. Wang, R.V. Coleman: Phys. Rev. B37, 6571 (1988)
B. Giambattista, A. Johnson, W.W. McNairy, C.G. Slough, R.V. Coleman: Phys. Rev. B38, 3545 (1988)
M. Tanaka, W. Mizutani, T. Nakashizu, N. Morita, S. Yamazaki, H. Bando, M. Ono, K. Kajimura: J. Microsc. 152, 183 (1988)
M. Tanaka, W. Mizutani, T. Nakashizu, S. Yamazaki, H. Tokumoto, H. Bando, M. Ono, K. Kajimura: Jpn. J. Appi. Phys. 28, 473 (1989)
C. Wang, B. Giambattista, C.G. Slough, R. Coleman: Bull. Am. Phys. Soc. 35, 209 (1990)
G. Boato, P. Cantini, R. Colella: Phys. Rev. Lett. 42, 1635 (1979)
P. Cantini, G. Boato, R. Colella: Physica B99, 59 (1980)
S. Baumgartner: “Rastertunnelmikroskopie auf Ladungsdichtewellen”; Diploma Thesis, University of Basel (1990)
X.L. Wu, P. Zhou, C.M. Lieber: Phys. Rev. Lett. 61, 2604 (1988)
X.L. Wu, P. Zhou, C.M. Lieber: Nature 335, 55 (1988)
X.L. Wu, C.M. Lieber: J. Am. Chem. Soc. 111, 2731 (1989)
X.L. Wu, C.M. Lieber: Phys. Rev. B41, 1239 (1990)
X.L. Wu, C.M. Lieber: J. Am. Chem. Soc. 110, 5200 (1988)
C.B. Scruby, P.M. Williams, G.S. Parry: Phil. Mag. 31, 255 (1975)
K. Nakanishi, H. Shiba: J. Phys. Soc. Jpn. 43, 1839 (1977)
K. Nakanishi, H. Takatera, Y. Yamada, H. Shiba: J. Phys. Soc. Jpn. 43, 1509 (1977)
A. Yamamoto: Phys. Rev. B27, 7823 (1983)
J.W. Lyding, J.S. Hubacek, G. Gammie, S. Skala, R. Brockenbrough, J.R. Shapley, M.P. Keyes: J. Vac. Sci. Technol. A6, 363 (1988)
E.G. Slough, B. Giambattista, A. Johnson, W.W. McNairy, R.V. Coleman: Phys. Rev. B39, 5496 (1989)
C.G. Slough, R.V. Coleman: Phys. Rev. B40, 8042 (1989)
G. Gammie, J.S. Hubacek, S.L. Skala, R.T. Brockenbrough, J.R. Tucker, J.W. Lyding: Phys. Rev. B40, 9529 (1989)
G. Gammie, J.S. Hubacek, S.L. Skala, R.T. Brockenbrough, J.R. Tucker, J.W. Lyding: Phys. Rev. B40, 11965 (1989)
C.G. Slough, B. Giambattista, W.W. McNairy, R.V. Coleman: J. Vac. Sci. Technol. A8, 490 (1990)
J. Heil, J. Wesner, B. Lommel, W. Assmus, W. Grill: J. Appi. Phys. 65, 5220 (1989)
D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt, G. Grüner: Europhys. Lett. 12, 241 (1990)
E. Garfunkel, G. Rudd, D. Novak, S. Wang, G. Ebert, M. Greenblatt, T. Gustafsson, S.H. Garofahni: Science 246, 99 (1989)
K. Nomura, K. Ichimura: Solid State Commun. 71, 149 (1989)
K. Nomura, K. Ichimura: J. Vac. Sci. Technol. A8, 504 (1990)
J.G. Bednorz, K.A. Müller: Z. Phys. B64, 189 (1986)
M.C. Gallagher, J.G. Adler: J. Vac. Sci. Technol. A8, 464 (1990)
M.D. Kirk, J. Nogami, A.A. Baski, D.B. Mitzi, A. Kapitulnik, T.H. Geballe, C.F. Quate: Science 242, 1673 (1988)
C.K. Shih, R.M. Feenstra, J.R. Kirtley, G.V. Chandrashekhar: Phys. Rev. B40, 2682 (1989)
X.L. Wu, C.M. Lieber, D.S. Ginley, R.J. Baughman: Appi. Phys. Lett. 55, 2129 (1989)
Y. Le Page, W.R. McKinnon, J.-M. Tarascón, P. Barboux: Phys. Rev. B40, 6810 (1989)
M. Tanaka, T. Takahashi, H. Katayama-Yoshida, S. Yamazaki, M. Fujinami, Y. Okabe, W. Mizutani, M. Ono, K. Kajimura: Nature 339, 691 (1989)
M. Tanaka, S. Yamazaki, M. Fujinami, T. Takahashi, H. Katayama-Yoshida, W. Mizutani, K. Kajimura, M. Ono: J. Vac. Sci. Technol. A8, 475 (1990)
N.J. Zheng, U. Knipping, I.S.T. Tsong, W.T. Petuskey, J.C. Barry: J. Vac. Sci. Technol. A6, 457 (1988)
L.E.C van de Leemput, P.J.M. van Bentum, L.W.M. Schreurs, H. van Kempen: Physica C152, 99 (1988)
L.E.C van de Leemput, P.J.M. van Bentum, F.A.J.M. Driessen, J.W. Gerritsen, H. van Kempen, L.W.M. Schreurs, P. Bennema: J. Microsc. 152, 103 (1988)
C.J. Chen, C.C. Tsuei: Solid State Commun. 71, 33 (1989)
K. Takata, S. Hosoki, S. Hosaka, T. Tajima: Rev. Sci. Instrum. 60, 789 (1989)
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Wiesendanger, R., Anselmetti, D. (1992). STM on Layered Materials. In: Güntherodt, HJ., Wiesendanger, R. (eds) Scanning Tunneling Microscopy I. Springer Series in Surface Sciences, vol 20. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-97343-7_6
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