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Feldspar Minerals pp 461–510Cite as

Electron-optical Techniques

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Abstract

Bombardment by electrons results in various phenomena of which the following are most useful for the study of feldspars:

  1. (1)

    emission of X-rays whose wavelength and intensity permit chemical analysis of major and minor elements — see Chapter 13 for technique of electron probe microanalysis which allows chemical analysis of surface areas a few micrometers across

  2. (2)

    emission of light (cathodoluminescence) whose wavelength and intensity permits rapid evaluation of chemical zoning and crystallization conditions involving certain trace elements and physical defects — see Chapter 12

  3. (3)

    diffraction and absorption of electrons: the techniques of transmission electron diffraction and microscopy (TEM) permit measurement of the texture and atomic arrangements right down to domains a few unit-cells across — this is the main topic of the chapter

  4. (4)

    emission of secondary electrons from the surface: the technique of scanning electron microscopy (SEM) allows determination of the topography of the surface. In addition, the technique of photo-emission-electron-microscopy (PEEM) utilizes electrons emitted from a surface irradiated by ultraviolet radiation: focusing of the electrons produces an image of the surface whose intensity depends on the chemical concentration.

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Authors and Affiliations

  1. Department of the Geophysical Sciences, The University of Chicago, 60637, Chicago, IL, USA

    Professor Dr. Joseph V. Smith

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  1. Professor Dr. Joseph V. Smith
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© 1974 Springer-Verlag Berlin Heidelberg

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Smith, J.V. (1974). Electron-optical Techniques. In: Feldspar Minerals. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-96173-1_11

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  • DOI: https://doi.org/10.1007/978-3-642-96173-1_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-96175-5

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