Aufgaben der Messtechnik und Mustererkennung in Rechnerintegrierten Fertigungssystemen

  • Ulrich Rembold
Conference paper
Part of the Fachberichte Messen · Steuern · Regeln book series (FACHBERICHTE, volume 1)

Modern Measuring and Pattern Recognition Techniques in Computer Integrated Manufacturing Systems


Computer integrated manufacturing systems are presently being developed in several countries. It is believed that they will substantially help to increase the productivity and the flexibility in manufacturing. One of the basic requirements for these systems is the availability of pattern recognition and measuring equipment. The necessary intelligence of this equipment will be enhanced with the help of mini and microcomputers. There will be hierarchical measuring systems which will be integrated into the computer hierarchy of manufacturing organisations. Presently there is a need to develop low cost pattern recognition devices and to obtain standardized instrument bus systems.

Statistical evaluation techniques for data should also be reviewed. Many well known procedures which so far were impractical to apply because of the large number of calculations to be performed can render good results when used with the help of the computer. Thus better predictions can be made on the product quality and the behavior of the process. With the computer it is also possible to design self calibrating instruments and new filtering techniques for data. One of the major problems is programming of microcomputers.

Although there are several techniques available today better aids are needed.


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Copyright information

© Springer-Verlag Berlin · Heidelberg 1977

Authors and Affiliations

  • Ulrich Rembold
    • 1
  1. 1.Lehrstuhl für Planungs- und Programmiertechniken für ProzeßrechnerUniversität KarlsruheDeutschland

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