Improvement in Electro-Optical Characteristics of CaS:Eu Electroluminescent Devices

  • M. Ando
  • Y. A. Ono
  • K. Onisawa
  • H. Kawakami
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 38)

Abstract

Electro-optical characteristics of rare-earth doped alkaline-earth-sulfide electroluminescent(EL) devices were studied. Measurement of luminance and transferred charge responses in CaS:Eu. CaS:Ce, SrS:Eu, and SrS:Ce EL devices revealed that rare-earth luminescent centers played a decisive role in controlling electro-optical characteristics. Especially, Eu was found to be the cause of the slow electro-optical response and a sharp decrease of luminance and transferred charge with a decrease of frequency in CaS:Eu. These characteristics were improved by co-doping a small amount of Ce to CaS:Eu. Especially, by doping 0.05mol% Ce to CaS:Eu(0.2mol%), the transferred charge response time decreased one-and-a-half orders of magnitudes and became almost the same as that of ZnS:Mn.

Keywords

Kano 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S. Tanaka et al.: Proc. SID 26/4, 255 (1985).Google Scholar
  2. 2.
    Y. Tamura et al.: Jpn. J. Appl. Phys. 25, L105(1986).ADSCrossRefGoogle Scholar
  3. 3.
    K. Tanaka et al.: Appl. Phys. Lett. 48, 1730 (1986).ADSCrossRefGoogle Scholar
  4. 4.
    S. Tanaka et al.: Proc. SID, 28, 357 (1987).Google Scholar
  5. 5.
    S. Tanaka, J. Lumin.: 40&41, 20(1988).CrossRefGoogle Scholar
  6. 6.
    W.A. Barrow et al.: 1988 SID Digest, 284(1988).Google Scholar
  7. 7.
    R.S. Crandall et al.: 1987 SID Digest, 245(1987).Google Scholar
  8. 8.
    R.S. Crandall: Appl. Phys. Lett., 50, 551 (1987).ADSCrossRefGoogle Scholar
  9. 9.
    R.S. Crandall: Appl. Phys. Lett., 50, 641 (1987).ADSCrossRefGoogle Scholar
  10. 10.
    R.S. Crandall and M. Ling: J. Appl. Phys., 62, 3074 (1987).ADSCrossRefGoogle Scholar
  11. 11.
    V.P. Singh et al.: IEEE Trans. Electron Devices, ED-35, 38 (1988).ADSGoogle Scholar
  12. 12.
    S. Tanaka et al.: Appl. Phys. Lett., 51, 1661 (1987).ADSCrossRefGoogle Scholar
  13. 13.
    S. Tanaka et al.: Proc. SID, 29, 77 (1988).Google Scholar
  14. 14.
    Y.A. Ono et al.: J. Lumin., 40&41, 796 (1988).CrossRefGoogle Scholar
  15. 15.
    Y.A. Ono et al.: Jpn. J. Appl. Phys., 26, 1482 (1987).ADSCrossRefGoogle Scholar
  16. 16.
    W. Lehmann and F.M. Ryan: J. Electrochem. Soc., 118, 477 (1971).CrossRefGoogle Scholar
  17. 17.
    H. Yamamoto and T. Kano: J. Electrochem. Soc, 126, 305 (1979).CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin, Heidelberg 1989

Authors and Affiliations

  • M. Ando
    • 1
  • Y. A. Ono
    • 1
  • K. Onisawa
    • 1
  • H. Kawakami
    • 2
  1. 1.Hitachi Research LaboratoryHitachi Ltd.Hitachi-shi, Ibaraki-kenJapan
  2. 2.Mobara WorksHitachi Ltd.Mobara-shi, Chiba-ken 297Japan

Personalised recommendations