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The Relation of Thin Film Electroluminescence and Photoluminescence Excitation Spectra

  • Zhilin Zhang
  • Zhuotong Li
  • Biao Mei
  • Xueyin Jiang
  • Peifang Wu
  • Shaohong Xu
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 38)

Abstract

The optical excitation spectra of many materials which have been used in thin film electroluminescence (TFEL) have been measured. It is found that for more efficient TFEL materials they always have some impurity excitation peaks in the long wavelength side. This can be used to select the new material for TFEL. The Mn, Tb have very different behavior in ZnS and CaS TFEL; it can be explained by the lattice symmetry.

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Copyright information

© Springer-Verlag Berlin, Heidelberg 1989

Authors and Affiliations

  • Zhilin Zhang
    • 1
  • Zhuotong Li
    • 1
  • Biao Mei
    • 1
  • Xueyin Jiang
    • 1
  • Peifang Wu
    • 1
  • Shaohong Xu
    • 1
  1. 1.Department of Materials ScienceShanghai University of Science and TechnologyShanghaiP.R. China

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