Thermally Stimulated Currents in Thin Film Electroluminescent Devices

  • Y. Sano
  • K. Nunomura
Part of the Springer Proceedings in Physics book series (SPPHY, volume 38)


New signals from thermally stimulated currents were observed on thin film electroluminescent devices. The signals originate from polarization charge at the interface between a ZnS layer and an insulating layer. The interface trap depths ranged from 1.8 to 1.9 eV, which is about half the ZnS energy gap.


Interface Trap Trap Depth Thermally Stimulate Current Conduction Charge Thermally Stimulate Current Spectrum 
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Copyright information

© Springer-Verlag Berlin, Heidelberg 1989

Authors and Affiliations

  • Y. Sano
    • 1
  • K. Nunomura
    • 1
  1. 1.Opto-electronics Research LaboratoriesNEC CorporationMiyamae-ku, Kawasaki 213Japan

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