Thermally Stimulated Currents in Thin Film Electroluminescent Devices
New signals from thermally stimulated currents were observed on thin film electroluminescent devices. The signals originate from polarization charge at the interface between a ZnS layer and an insulating layer. The interface trap depths ranged from 1.8 to 1.9 eV, which is about half the ZnS energy gap.
KeywordsInterface Trap Trap Depth Thermally Stimulate Current Conduction Charge Thermally Stimulate Current Spectrum
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- 4.T. Tatsumi et al., The Institute of Electronics, Information and Communication Engineers Technical Report, 87, No. 407 (1987) p.49 (in Japanese).Google Scholar
- 5.K. Miyashita and M. Shibata, Digest of Japan Display’ 83, p.100.Google Scholar
- 6.T. Shibata et al., Extended Abstracts (The 34th Spring Meeting, 1987); The Japan Soc. of Appl. Phys. and Related Societies, No. 3, p.879 (in Japanese).Google Scholar
- 7.T. Inoguchi and S. Mito: In Electroluminescence, ed. by J.I. Pankove, Topics in Applied Physics, Vol.17 (Springer, Berlin, Heidelberg, New York, 1977) p.197.Google Scholar