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Polycrystalline Semiconductors pp 89–94Cite as

SEM-EBIC Investigations of the Electrical Activity of Grain Boundaries in Germanium

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Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 35))

Abstract

The electrical activity of various grain boundaries (GBs) including subgrains and highly misorientated GBs, has been studied using the EBIC-mode of a scanning electron microscope. The crystallography of the defects has been characterized from electron channeling patterns (ECP) and X-ray topographs. The electrical behaviour of GBs has been found strongly affected by impurity segregation. Bright EBIC contrast observed at some GBs after annealing has been related to the degradation of the diffusion length of holes in the adjacent grains. EBIC observations performed at low temperature revealed the presence of a trapping process of the holes on a near-valence band level.

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References

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Author information

Author notes

  1. N. Tabet

    Present address: Institute of Physics, University of Constantine, Algeria

Authors and Affiliations

  1. Laboratoire de Physique des Matériaux, CNRS, 1, place A. Briand, F-92195, Meudon, France

    N. Tabet & C. Monty

  2. Laboratoire de Physique des Solides, CNRS, F-92195, Meudon, France

    Y. Marfaing

Authors
  1. N. Tabet
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  2. C. Monty
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  3. Y. Marfaing
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Editor information

Editors and Affiliations

  1. Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH, 44106, USA

    Hans J. Möller

  2. Technische Universität Hamburg-Harburg, D-2100, Hamburg 90, Fed. Rep. of Germany

    Horst P. Strunk

  3. Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, D-7000, Stuttgart 80, Fed. Rep. of Germany

    Jürgen H. Werner

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© 1989 Springer-Verlag Berlin, Heidelberg

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Tabet, N., Monty, C., Marfaing, Y. (1989). SEM-EBIC Investigations of the Electrical Activity of Grain Boundaries in Germanium. In: Möller, H.J., Strunk, H.P., Werner, J.H. (eds) Polycrystalline Semiconductors. Springer Proceedings in Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-93413-1_12

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  • DOI: https://doi.org/10.1007/978-3-642-93413-1_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-93415-5

  • Online ISBN: 978-3-642-93413-1

  • eBook Packages: Springer Book Archive

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