Abstract
The aim of this work is to study problems regarding transport and noise phenomena appearing in modelisation of microwave semiconductor devices using silicon or gallium arsenide, in which non steady conditions might have an effect upon the carrier dynamics. In recent years, Monte-Carlo simulation was revealed to be a powerful tool to get the characteristic transport parameters of materials [1, 2]. If such information has been applied to the study of components [3, 4], Monte-Carlo techniques have not been used for a direct simulation of noise in real devices.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
C. CANALI, C. JACOBONI, F. NAVA, G. OTTAVIANI, A. A.GERIGHI-QUARANTA, Phys. Rev. B, 12, 2265–2284 (1975)
W. FAWCETT, A.D. BOARDMAN, S. SWAIN J. Phys. Chem. Solids, 31, 1963–1990 (1970)
T.J. MALONEY, J. FREY J. Appl. Physics, 48, 781–787 (1977)
G.HILL, P.N. ROBSON, A. MAJERFELD, W. FAWCETT, Electron. Letters, 13, 235–236 (1977)
W. FAWCETT, H.D. REES, Phys. Letters, 29A, 578–579 (1969)
C. CANALI, C. JACOBONI, G. OTTAVIANI, A. ALBERIGHI-QUARANTA Appl. Phys. Letters, 27, 278–280 (1975)
J. ZIMMERMANN, Y. LEROY, E. CONSTANT, Accepted in J. Appl. Physics 1978
B. BOITTIAUX, Y. BECQUELIN, J.M. JENDRZEJCZAK, E. CONSTANT, Rev. Phys. Appliquée, 12, 1663–1677 (1977)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1978 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Zimmermann, J., Leroy, Y., Kaszynski, A., Carnez, B. (1978). Monte Carlo Calculation of Non-Steady State Hot Electron Noise in Very Short Channel n-Si and n-GaAs Devices. In: Wolf, D. (eds) Noise in Physical Systems. Springer Series in Electrophysics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87640-0_14
Download citation
DOI: https://doi.org/10.1007/978-3-642-87640-0_14
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-87642-4
Online ISBN: 978-3-642-87640-0
eBook Packages: Springer Book Archive