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Buried K-Fullerides by Ion Implantation

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Electronic Properties of Fullerenes

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 117))

Abstract

We report the formation of buried K-fulleride layers by high dose implantation of 30 keV K+ at different implant temperatures. Raman scattering showed a transformation of fullerene molecules to amorphous carbon (a-C) within the range of the implanted ions. The microscopic structure of the a-C is discussed. At elevated implant temperatures potassium accumulates underneath the a-C layer. This behaviour is explained in terms of the formation process of a K-fulleride. For comparison, results obtained on Ar+ implanted fullerene films are presented.

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© 1993 Springer-Verlag Berlin Heidelberg

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Kastner, J., Palmetshofer, L., Bauer, P., Stingeder, G., Kuzmany, H. (1993). Buried K-Fullerides by Ion Implantation. In: Kuzmany, H., Fink, J., Mehring, M., Roth, S. (eds) Electronic Properties of Fullerenes. Springer Series in Solid-State Sciences, vol 117. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-85049-3_7

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  • DOI: https://doi.org/10.1007/978-3-642-85049-3_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-85051-6

  • Online ISBN: 978-3-642-85049-3

  • eBook Packages: Springer Book Archive

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