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Low-Temperature Scanning Tunneling Microscopy Study of C60 Fullerite

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Electronic Properties of Fullerenes

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 117))

Abstract

We have used a scanning tunneling microscope (STM) to study monolayer coverages of C60 on a Au(111) substrate at 4.5 K. The STM images clearly show internal structure on all C60 molecules. The patterns can be related to a structural model of the C60 molecule assuming the corrugation maxima correspond to the centers of the carbon ring structures.

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© 1993 Springer-Verlag Berlin Heidelberg

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Behler, S. et al. (1993). Low-Temperature Scanning Tunneling Microscopy Study of C60 Fullerite. In: Kuzmany, H., Fink, J., Mehring, M., Roth, S. (eds) Electronic Properties of Fullerenes. Springer Series in Solid-State Sciences, vol 117. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-85049-3_38

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  • DOI: https://doi.org/10.1007/978-3-642-85049-3_38

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-85051-6

  • Online ISBN: 978-3-642-85049-3

  • eBook Packages: Springer Book Archive

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