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K-C60:Growth Structures, Phase Formation, and Electronic Properties

  • J. H. Weaver
  • D. M. Poirier
  • Y. B. Zhao
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 117)

Abstract

This paper focuses on K-C60 thin films. Scanning tunneling microscopy shows that high quality films can be grown epitaxially on GaAs(110), ultraviolet photoemission shows the complex nature of the electronic states of the K3C60 phase, and x-ray photoemission reveals the phase diagram for this system.

Keywords

Lower Unoccupied Molecular Orbital Scanning Tunneling Microscopy Octahedral Site Lower Unoccupied Molecular Orbital Scanning Tunneling Microscopy Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    For reviews, see J.H. Weaver in Solid State Physics, ed. H. Ehrenreich and F. Spaepen (Academic Press) and the special issue of J. Phys. Chem. Solids dedicated to fullerenes [vol. 53, pp. 1321–1486 (1992)].Google Scholar
  2. 2.
    J. Winter and H. Kuzmany, Solid State Commun. 84, 935 (1992).ADSCrossRefGoogle Scholar
  3. 3.
    D.M. Poirier, T.R. Ohno, G.H. Kroll, P.J. Benning, F. Stepniak, J.H. Weaver, L.P.F. Chibante, and R.E. Smalley, P hys. Rev. B (15 April 1993).Google Scholar
  4. 4.
    D.M. Poirier and J.H. Weaver, Phys. Rev. B (15 May 1993).Google Scholar
  5. 5.
    Y.Z. Li, J.C. Patrin, M. Chander, J.H. Weaver, K. Kikuchi, and Y. Achiba, Phys. Rev. B (15 April 1993).Google Scholar
  6. 6.
    Y.Z. Li, M. Chander, J.C. Patrin, J.H. Weaver, L.P.F. Chibante, and R.E. Smalley, Science 253, 429 (1991).ADSCrossRefGoogle Scholar
  7. 7.
    J.L. Martins and N. Troullier, Phys. Rev. B 46, 1766 (1992); see also S. Saito and A. Oshiyama, ibid. 44, 11537 (1991); Y.-N. Xu, M.Z. Huang, and W.Y. Ching, ibid. 44, 13171 (1991); M.R Gelfand and J.P. Lu, Phys. Rev. Lett. 68, 1050 (1992); S. Satpathy et al., Phys. Rev. B 46, 1773 (1992); S.C. Erwin and W.E. Pickett, Science 254, 842 (1992).ADSCrossRefGoogle Scholar
  8. 8.
    P.J. Benning, J.L. Martins, J.H. Weaver, L.P.F. Chibante, and R.E. Smalley, Science 252, 1417 (1991).ADSCrossRefGoogle Scholar
  9. 9.
    P.J. Benning, F. Stepniak, D.M. Poirier, J.L. Martins, J.H. Weaver, L.P.F. Chibante, and R.E. Smalley, Phys. Rev. B (15 May 1993); J.H. Weaver, P.J. Benning, F. Stepniak and D.M. Poirier, J. Phys. Chem. Solids 53, 1707 (1992).Google Scholar
  10. 10.
    M. Knupfer, M. Merkel, M.S. Golden, J. Fink, O. Gunnarsson, and V.P. Antropov, Phys. Rev. B (submitted 2/5/93).Google Scholar
  11. 11.
    D.M. Poirier, T.R. Ohno, G.H. Kroll, Y. Chen, P.J. Benning, J.H. Weaver, L.P.F. Chibante, and R.E. Smalley, Science 253, 646 (1991).ADSCrossRefGoogle Scholar
  12. 12.
    R. Tycko et al. Science 253, 884 (1991)ADSCrossRefGoogle Scholar
  13. 13.
    Q. Zhu et al, submitted to Phys. Rev. B.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1993

Authors and Affiliations

  • J. H. Weaver
    • 1
  • D. M. Poirier
    • 1
  • Y. B. Zhao
    • 1
  1. 1.Department of Materials Science and Chemical EngineeringUniversity of MinnesotaMinneapolisUSA

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