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Scanning Tunneling Microscopy on Clean and Adsorbate-Covered Semiconductor and Metal Surfaces

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Book cover Surface Science

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 73))

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Abstract

Representative for the use of scanning tunneling microscopy in surface science, results will be described for the systems Fe/Cu(111), Ag/Ni(100), K/Si(100)2xl and O2/Si(100)2xl. Results for the clean substrate surfaces Cu(111) and Si(100)2x1 will also be shown. The results are supplemented with a brief survey of theoretical models and a description of experimental details.

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References

  1. For an overview of recent literature the reader is referred to one of the latest proceedings of the international STM conferences, e.g., J. Vac. Sci. Technol. B 9, 401–1411 (1991).

    Google Scholar 

  2. M. Tsukada, K. Kobayashi, N. Isshiki and H. Kageshima, Surf. Sci. Repts. 13, 267 (1991).

    Article  Google Scholar 

  3. H. Neddermeyer and M. D echsler, J. Microscopy 152, 459 (1988); H. Wengelnik and H. Ned ermeyer, J. Vac. Sci. Technol. A 8, 438 (1990).0

    Google Scholar 

  4. A. Brodde and H. Ned ermeyer, Ultramicroscopy (to be published).

    Google Scholar 

  5. A. Brodde and H. Neddermeyer, J. Vac. Sci. Technol. B 9, 920 (1991).

    Article  CAS  Google Scholar 

  6. A. Brodde, T. Bertrams and H. Neddermeyer (to be published).

    Google Scholar 

  7. R. Kliese, B. Röttger and H. Neddermeyer, Ultramicroscopy (to be published).

    Google Scholar 

  8. R. Wolkow and Ph. Avouris, Phys. Rev. Lett. 60, 1049 (1988); Ph. Avouris, In-Whan Lyo and F. Bozso, J. Vac. Sci. Technol. B 9, 424 (1991).

    Article  CAS  Google Scholar 

  9. J. Tersoff and D.R. Hamann, Phys. Rev. B 31, 805 (1985).

    Article  CAS  Google Scholar 

  10. T.E. Feuchtwang P.H. Cutler and N.M. Miskovsky Phys. Lett. 99A 167 1983); M.S. Chung, T.E. Feuchtwang, and P.H. Cutler, Surf. Sci. 187, 559 (1987)

    CAS  Google Scholar 

  11. G. Doyen, D. Drakova and M. Scheffler (to be published).

    Google Scholar 

  12. C. Noguera, J. Microscopy 152, 3 (1988).

    Google Scholar 

  13. N.D. Lang, Phys. Rev. B 34, 5947 (1986).

    Article  Google Scholar 

  14. G. Doyen, D. Drakova, E. Kopatzki and R.J. Behm, J. Vac. Sci. Technol. A 6, 327 (1988).

    CAS  Google Scholar 

  15. Ch. Gerber G. Binnig, H. Fuchs, O. Marti and H. Rohrer, Rev. Sci. Instrum. 57, 251 (1986).

    Article  Google Scholar 

  16. Th. Berghaus, A. Brodde, H. Neddermeyer and St. Tosch, Surf. Sci. 184, 273 (1987).

    Article  CAS  Google Scholar 

  17. W. Kümmerle and U. Gradmann, phys. stat. sol. (a) 45, 171 (1978).

    Article  Google Scholar 

  18. W. Keune, R. Halbauer, U. Gonser, J. Lauer and D.L. Williamson, J. Appl. Phys. 48, 2976 (1977).

    Article  CAS  Google Scholar 

  19. U. Gradmann and P. Tillmanns, phys. stat. sol. (a) 44, 539 (1977).

    Article  CAS  Google Scholar 

  20. R.J. Behm, W. Hösier, E. Ritter and G. Binnig, Phys. Rev.Lett. 56, 1765 (1985).

    Google Scholar 

  21. F. Jensen, F. Besenbacher, E. Lægsgaard and I. Stensgaard, Phys. Rev. B 41, 10 233 (1990).

    CAS  Google Scholar 

  22. D.M. Eigler, P.S. Weiss and E.K. Schweizer, Phys. Rev. Lett. 66, 1189 (1991).

    Article  CAS  Google Scholar 

  23. R. J. Hamers, R.M. Tromp and J.E. Demuth, Phys. Rev. B 34, 5343 (1996).

    Google Scholar 

  24. For an overview on recent literature on K/Si(100)2x1 see I.P. Batra, Phys. Rev. B 43, 12 322 (1991).

    Google Scholar 

  25. F. Besenbacher, F. Jensen, E. Lægsgaard, K. Mortensen and I. Stensgaard, J. Vac. Sci. Technol. 9, 874 (1991).

    Article  CAS  Google Scholar 

  26. D. Cahill and Ph. Avouris, Ultramicroscopy (to be published).

    Google Scholar 

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Author information

Authors and Affiliations

  1. Institut für Experimentalphysik der Ruhr-Universität Bochum, Postfach 10 21 48, W-4630, Bochum, Germany

    H. Neddermeyer

Authors
  1. H. Neddermeyer
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Editor information

Editors and Affiliations

  1. Department of Physical Chemistry, University of New South Wales, P. O. Box 1, Kensington, NSW, 2033, Australia

    Russel F. Howe  & Robert N. Lamb  & 

  2. Institut für Physikalische und Theoretische Chemie, Universität Bonn, Wegelerstrasse 12, W-5300, Bonn, Germany

    Klaus Wandelt

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© 1993 Springer-Verlag Berlin Heidelberg

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Neddermeyer, H. (1993). Scanning Tunneling Microscopy on Clean and Adsorbate-Covered Semiconductor and Metal Surfaces. In: Howe, R.F., Lamb, R.N., Wandelt, K. (eds) Surface Science. Springer Proceedings in Physics, vol 73. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84933-6_1

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  • DOI: https://doi.org/10.1007/978-3-642-84933-6_1

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84935-0

  • Online ISBN: 978-3-642-84933-6

  • eBook Packages: Springer Book Archive

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