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Anisotropy Imaging of Materials

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Phonon Scattering in Condensed Matter VII

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 112))

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Abstract

We describe in this paper an imaging technique in which a pulsed laser, operating as an ultrasonic point-source, is scanned across the surface of a specimen and the generated elastic waves are detected by a point-receiver. The signals detected along a scan line, comprise a scan image which contains the spatial- and temporal-dependence of the elastic wave field in a specimen that can be processed to recover all the elastic constants of the material and to detect microstructural features, including damage. By monitoring the amplitude of a particular wave arrival over a number of scan lines, an anisotropy image is generated that is analogous to a ballistic-phonon image but differs from it in that the measurements are made at MHz frequencies, at ambient temperatures and in metals and non-metals alike. We show the results of measurements made on single crystal specimens of Si, zinc and in a number of polymeric composite materials. Anisotropy-induced focusing effects are observed in particular directions in each of these materials. An interpretation of these images has been obtained using Monte Carlo simulation.

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References

  1. W. Sachse, B. Castagnede, I. Grabec, K. Y. Kim and R. L. Weaver, Ultrasonics, 28, 97–104 (1990).

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  2. A. G. Every and W. Sachse, Physical Review B, 42(13), 8196–8205 (1990).

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  3. A. G. Every and W. Sachse, Physical Review B, 44(13), 6689–6699 (1991).

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© 1993 Springer-Verlag Berlin Heidelberg

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Sachse, W., Every, A.G., Thompson, M.O. (1993). Anisotropy Imaging of Materials. In: Meissner, M., Pohl, R.O. (eds) Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences, vol 112. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84888-9_27

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  • DOI: https://doi.org/10.1007/978-3-642-84888-9_27

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84890-2

  • Online ISBN: 978-3-642-84888-9

  • eBook Packages: Springer Book Archive

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