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Normal-State Infrared Response from Ellipsometric Measurements: YBa2Cu3O7 and PrBa2CU3O7

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Electronic Properties of High-Tc Superconductors

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 113))

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Abstract

We perform quantitative estimates of the sensitivity of normal-incidence reflectance to measurement errors and to extrapolation beyond the range covered by measurements, which is needed to compute the Kramers-Kronig integral. A similar analysis is made for the ellipsometric technique, which provides both real and imaginary parts of the response functions at each photon energy. The feasibility of determination of the components of dielectric tensor for highly anisotropic materials is demonstrated. We discuss the midand near-infrared ellipsometric data obtained on oriented films of YBa2Cu3O7 and PrBa2Cu3O7.

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References

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Authors and Affiliations

  1. Faculty of Science, Department of Solid State Physics, Masaryk University, Kotlářská 2, 611 37, Brno, Czechoslovakia

    J. Humlíček

Authors
  1. J. Humlíček
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Editor information

Editors and Affiliations

  1. Institut für Festkörperphysik, Universität Wien, Strudlhofgasse 4, A-1090, Wien, Austria

    Hans Kuzmany

  2. 2. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, W-7000, Stuttgart, Fed. Rep. of Germany

    Michael Mehring

  3. Institut für Nukleare Festkörperphysik, Kernforschungszentrum Karlsruhe, Postfach 3640, W-7500, Karlsruhe, Fed. Rep. of Germany

    Jörg Fink

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© 1993 Springer-Verlag Berlin, Heidelberg

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Humlíček, J. (1993). Normal-State Infrared Response from Ellipsometric Measurements: YBa2Cu3O7 and PrBa2CU3O7 . In: Kuzmany, H., Mehring, M., Fink, J. (eds) Electronic Properties of High-Tc Superconductors. Springer Series in Solid-State Sciences, vol 113. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84865-0_40

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  • DOI: https://doi.org/10.1007/978-3-642-84865-0_40

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84867-4

  • Online ISBN: 978-3-642-84865-0

  • eBook Packages: Springer Book Archive

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