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Transport Phenomena in Mesoscopic Systems pp 235–253Cite as

Three “Universal” Mesoscopic Josephson Effects

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Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 109))

Abstract

A recent theory is reviewed for the sample-to-sample fluctuations in the critical current of a Josephson junction consisting of a disordered point contact or microbridge. The theory is based on a relation between the super-current and the scattering matrix in the normal state. The root-mean-square amplitude rms I c of the critical current I c at zero temperature is given by rms I c ≃ eΔ0/ℏ, up to a numerical coefficient of order unity (eΔ0 is the energy gap). This is the superconducting analogue of “Universal Conductance Fluctuations” in the normal state. The theory can also be applied to a ballistic point contact, where it yields the analogue of the quantized conductance, and to a quantum dot, where it describes supercurrent resonances. All three phenomena provide a measurement of the supercurrent unit eΔ0/ℏ, and are “universal” through the absence of a dependence on junction parameters.

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Authors and Affiliations

  1. Instituut-Lorentz, University of Leiden, P.O. Box 9506, NL-2300 RA, Leiden, The Netherlands

    C. W. J. Beenakker

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  1. C. W. J. Beenakker
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Editors and Affiliations

  1. Department of Physics, Faculty of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan

    Hidetoshi Fukuyama

  2. Institute for Solid State Physics, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan

    Tsuneya Ando

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© 1992 Springer-Verlag Berlin Heidelberg

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Beenakker, C.W.J. (1992). Three “Universal” Mesoscopic Josephson Effects. In: Fukuyama, H., Ando, T. (eds) Transport Phenomena in Mesoscopic Systems. Springer Series in Solid-State Sciences, vol 109. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84818-6_22

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  • DOI: https://doi.org/10.1007/978-3-642-84818-6_22

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84820-9

  • Online ISBN: 978-3-642-84818-6

  • eBook Packages: Springer Book Archive

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