Abstract
We discuss two different types of surface disorder: atomic-scale roughness and disorder induced by surface melting. The roughening of a surface during, e.g., a crystal growth process can be monitored in situ by X-ray scattering. As an example the deposition of Ge atoms on Ge(111) is followed in time. For the detection of disorder induced by surface melting the technique of medium-energy ion scattering can be used to advantage. We will discuss recent ion scattering studies of the thermal disordering of the Al(110) and Ge(111) surfaces.
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References
See. e.g. M. Wortis, in: Chemistry and Physics of Solid Surfaces VII, Springer Series in Surface Sciences, Vol. 10, Eds. R. Vanselow and R.F. Howe ( Springer, Heidelberg, 1988 ) p. 367.
J.F. van der Veen, B. Pluis and A.W. Denier van der Gon, in: Chemistry and Physics of Solid Surfaces VII, Springer Series in Surface Sciences, Vol. 10, Eds. R. Vanselow and R.F. Howe ( Springer, Heidelberg, 1988 ) p. 455.
J.G. Dash, Contemp. Phys. 30, 89 (1989).
R. Feidenhans, Surface Sci. Rept. 10, 105 (1980) and references therein.
I.K.Robinson, Phys. Rev. B33, 3830 (1986).
E. Vlieg, J.F. van der Veen, S.J. Gurman, C. Norris and J.E. Macdonald, Surface Sci. 210, 301 (1989).
J. Lapujoulade and B. Salanon, in: Phase Transitions in Surface Films, NATO ASI series, Ed. H. Taub (Plenum, New York), in press.
I.K. Robinson, E.H. Conrad and D.S. Reed, J. Phys. France 51, 103 (1990).
B. Pluis, J.-M. Gay, J.W.M. Frenken, S. Gierlotka, J.F. van der Veen, J.E. Macdonald, A.A. Williams, N. Piggins and J. Als-Nielsen, Surface Sci. 222, L845 (1989).
P.H. Fuoss, L.J. Norton and S. Brennan, Phys. Rev. Letters 60, 2046 (1988).
J.F. van der Veen, Surface Sci. Rept. 5, 199 (1985).
E. Vlieg, A.W. Denier van der Gon, J.F. van der Veen, J.E. Macdonald and C. Norris, Phys. Rev. Lett. 61, 2241 (1988).
R.G. van Silfhout, J.W.M. Frenken, J.F. van der Veen, S. Ferrer, A. Johnson, H. Derbyshire, C. Norris and J.E. Macdonald, J. Phys.France 50, C7, 295 (1989).
R. Feidenhans’1, J.S. Pedersen, J. Bohr, M. Nielsen, F. Grey and R.L. Johnson, Phys. Rev. B38, 9715 (1988).
R.G. van Silfhout, J.F. van der Veen, C. Norris and J.E. Macdonald, J. Chem. Soc. Faraday Discussion 89 (1990), in press.
See, e.g.: High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces, NATO ASI series, Eds. P.K. Larsen and P.J. Dobson ( Plenum, New York, 1988 ).
R.G. van Silfhout et al., to be published.
J.W.M. Frenken, P.M.J. Marée, and J.F. van der Veen, Phys. Rev. B34, 7506 (1986).
A.W. Denier van der Gon, R.J. Smith, J.-M. Gay, D.J. O’Connor and J.F. van der Veen, Surface Sci. 227, 143 (1990).
B. Pluis, A.W. Denier van der Gon, J.W.M. Frenken and J.F. van der Veen, Phys. Rev. Lett. 59, 2678 (1987).
E.G. McRae and R.A. Malic, Phys. Rev. B38, 13163 (1988).
A.W. Denier van der Gon, J.M. Gay, J.W.M. Frenken and J.F. van der Veen, Surface Sci., in press.
P.W. Palmberg, Surface Sci. 11, 153 (1968).
R.G. van Silfhout et al., to be published.
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© 1992 Springer-Verlag Berlin, Heidelberg
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van der Veen, J.F., van Silfhout, R.G., van der Gon, A.W.D. (1992). Ion and X-Ray Scattering Studies of Surface Disorder. In: Yoshimori, A., Shinjo, T., Watanabe, H. (eds) Ordering at Surfaces and Interfaces. Springer Series in Materials Science, vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84482-9_1
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DOI: https://doi.org/10.1007/978-3-642-84482-9_1
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