Skip to main content

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 43))

  • 228 Accesses

Abstract

One straightforward approach to building an ENDOR spectrometer is to take a conventional EPR spectrometer, add the ability to produce a sufficiently high radio-frequency magnetic field in the microwave cavity, modulate this field, and then try to detect the change of the EPR signal, the ENDOR signal, with a lock-in amplifier. However, this will usually not work satisfactorily.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Reference

  1. D.H. Whiffen: Molec. Phys. 10, 595 (1966)

    Article  ADS  Google Scholar 

  2. Ch. Hoentzsch, J.R. Niklas, J.-M. Spaeth: Rev. Sci. Instr. 49, 1100 (1978)

    Article  ADS  Google Scholar 

  3. H. Seidel: Z. angew. Physik 14, 21 (1962)

    Google Scholar 

  4. J.R. Niklas: “Elektronen-Kern-Doppelresonanz-Spektroskopie zur Strukturuntersuchung von Festkörperstörstellen”; Habilitationsschrift, Universität-GH Paderborn (1983)

    Google Scholar 

  5. K. Möbius, R. Biehl: in Multiple Electron Resonance Spectroscopy, ed. by M.M. Dorio and J.H. Freed (Plenum, New York 1979)

    Google Scholar 

  6. H. Seidel: Z. Physik 165, 218 (1961)

    Article  ADS  Google Scholar 

  7. C.P. Poole, Jr.: Electron Spin Resonance (Interscience, New York 1967)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1992 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Spaeth, JM., Niklas, J.R., Bartram, R.H. (1992). Technology of ENDOR Spectrometers. In: Structural Analysis of Point Defects in Solids. Springer Series in Solid-State Sciences, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84405-8_8

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-84405-8_8

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84407-2

  • Online ISBN: 978-3-642-84405-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics