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Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films pp 171–210Cite as

Spectroscopic Depth Profiling Using Thermal Waves

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Part of the book series: Topics in Current Physics ((TCPHY,volume 47))

Abstract

Spectroscopy can be used to gain information on the identity and concentration of chemical species present in a sample. Unfortunately, it is rarely possible to obtain the equivalent information on the spatial distribution of a chromophore. There are many samples where such information would be extremely valuable, ranging from the study of deposition processes, through chemical modification of surfaces to membrane transport. Spatial information in the x-y plane normal to the incident radiation can be readily obtained by the use of imaging detectors [7.1,2] or scanned spot systems [7.3,4]. Whether information can be obtained in the z direction through the sample thickness depends on the scale over which information is required. If selective information is required on the surface layers over a range of angstroms to nanometers, then techniques from conventional surface science can be used; for example photoelectron spectroscopy and high resolution electron energy loss spectroscopy [7.5]. For penetration depths of a micrometer or so, evanescent wave methods such as attenuated total reflection (ATR) may be suitable [7.6]. For scales of greater than a few hundred micrometers, the only practical techniques are destructive, involving sectioning of the sample to convert it into a thin planar geometry which can be examined by the methods described above. In the interesting region of a few micrometers to a few hundred micrometers, photoacoustic and photothermal methods offer the possbility of performing real nondestructive depth profiling on a wide range of sample types.

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  1. Physikalisch-Chemisches Institut der Universität, Im Neuenheimer Feld 253, D-6900, Heidelberg 1, Fed. Rep. of Germany

    Peter Hess

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Miller, R.M. (1989). Spectroscopic Depth Profiling Using Thermal Waves. In: Hess, P. (eds) Photoacoustic, Photothermal and Photochemical Processes at Surfaces and in Thin Films. Topics in Current Physics, vol 47. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83945-0_7

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  • DOI: https://doi.org/10.1007/978-3-642-83945-0_7

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