Abstract
Fundamental technology for advanced measurement seems to be switching over to photonics from traditional electronics. It may be due to the critical limit of electronics in ability of high speed, multichannel processing and so on. On the other hand, an ultrafast streak camera is well known as one of the most versatile instruments for measureing the dynamic behavior of luminous events in the picosecond and subpicosecond region.1
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References
Y. Tsuchiya, IEEE J. Quantum Electron., QE-20, 2, pp.1516–1528(1984)
Y. Tsuchiya, Proc. SPIE, Vol.491, pp.224–229 (1984)
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© 1987 Springer-Verlag Berlin Heidelberg
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Tsuchiya, Y., Koishi, M., Kinoshita, K. (1987). A New Sampling Optical Oscilloscope Based on Streak Camera Technology. In: Waidelich, W. (eds) Laser/Optoelektronik in der Technik / Laser/Optoelectronics in Engineering. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83174-4_59
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DOI: https://doi.org/10.1007/978-3-642-83174-4_59
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-18132-3
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