Abstract
Recently, the great improvement in material quality and processing techniques led to a revival of the field of hot electron devices. Devices having current gains greater than 10 have been made successfully. Moreover, the devices proved to be extremely useful as electron spectrometers, establishing unambiguously, for the first time, the existence of ballistic electrons in heavily doped GaAs. I review briefly the history of the hot electron devices, then describe their usefulness in studying device physics: for example, in the determination of the ballistic mean free path, in identifying the major scattering mechanisms influencing the transport, in observing the transfer of hot electrons into upper satellite valleys, and by exhibiting quantization effects that take place in small structures.
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References
C.A. Mead, Proc. IRE 48, 359 (1960);
C.A. Mead, J. App. Phys. 32, 646 (1961).
J. P. Spratt, R. F. Schwarz, and W. M. Kane, Phys. Rev. Lett. 6, 341 (1961).
D. V. Geppert, Proc. IRE 50, 1527 (1961)
D. Khang, Proc. IRE 50, 1534 (1961).
J.M. Shannon, IEE J. Solid-State & Electron Devices 3, 142 (1979).
M. Heiblum, IBM Technical Disclosure Y0881–0094, Feb. 1981, published in the IBM Technical Disclosure Magazine 24, 4507–9 (1982).
R.J. Malik, M.A. Hollis, L.F. Eastman, D.J. Woodard, C.E.C. Wood, and T.R. AuCoin, Proc. Conf. on Active Microwave Devices, Cornell Univ. (1981).
M.A. Hollis, S.C. Palmateer, L.F. Eastman, N.V. Dandekar, and P.M. Smith, Electron Device Lett. EDL-4, 440 (1983).
M. Heiblum, Thesis work, Univ. Cal. (Bekeley), 1978.
M. Heiblum, US patent no. 4,286,275, filed 1980.
M. Heiblum, Solid-State Electron. 24, 343 (1981).
N. Yokoyama, K Imamura, T. Ohshima, H. Nishi, S. Muto, K. Kondo, and S. Hiyamizu, IEEE Electron Device Meeting Proceedings, San Francisco (1984).
M. Heiblum, D. C. Thomas, C. M. Knoedler, and M. I. Nathan, Appl. Phys. Lett. 47, 1105 (1985).
M. Heiblum, M. I. Nathan, D. C. Thomas, and C. M. Knoedler, Phys. Rev. Lett. 55, 2200 (1985).
M. Heiblum, E. Calleja, I. M. Anderson, W. P. Dumke, C. M. Knoedler, and L. Osterling, Phys. Rev. Lett. 56, 2854 (1986).
M. Heiblum, I. M. Anderson, and C. M. Knoedler, Appl. Phys. Lett. 49, 207 (1986).
D. J. Barterlink, J. L. Moll, and N. I. Meyer, Phys. Rev. 130, 972 (1963).
P. Hesto, J-F. Pone, and R. Castagne, Appl. Phys. Lett. 40, 405 (1982).
J.R. Hayes, A.F.J. Levi, and W. Wiegmann, Electron. Lett. 20, 851 (1984);
J.R. Hayes, A.F.J. Levi, and W. Wiegmann, Phys. Rev. Lett. 54, 1570 (1985).
The fabrication of high-quality barriers requires some care [20]; if poor quality AIGaAs is made spectroscopy is impossible because of severe scattering in the alloy. For spectroscopy, the preferred barrier is an asymmetric, compositionally graded AIGaAs triangular barrier with a peak close to the base, mimicking the planar doped barrier transistor. This barrier enables the spectroscopy to be done closer to the base. However, controling the exact barrier shape is very difficult,thus making accurate spectroscopy impossible.
M. Heiblum, E. Mendez, and L. Osterling, J. Appl. Phys. 54, 6982 (1983).
A. F. J. Levi, J. R. Hayes, P. M. Platzman, and W. Wiegmann, Phys. Rev. Lett. 55, 2071 (1985).
D. Bohm, Quantum Theory (Prentice - Hall, New York, 1951), Part 3.
T. Hickmott, P. Solomon, R. Fischer, and H. Morkoc, J. Appl. Phys. 57, 2844 (1985).
P. M. Solomon, private communications.
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Heiblum, M. (1986). Ballistic Transport and Electron Spectroscopy in Tunnelling Hot Electron Transfer Amplifiers (THETA). In: Källbäck, B., Beneking, H. (eds) High-Speed Electronics. Springer Series in Electronics and Photonics, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82979-6_2
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DOI: https://doi.org/10.1007/978-3-642-82979-6_2
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