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Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance

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Ion Formation from Organic Solids (IFOS III)

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 9))

Abstract

In past years, many new ionization techniques — e.g. secondary ion mass spectroscopy (SIMS), fast atom bombardment (FAB), field desorption (FD) or laser desorption (LD) — have been introduced for mass spectroscopic investigations of polar compounds, thermally labile molecules and salts.

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References

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Author information

Authors and Affiliations

  1. Spectrospin AG, Industriestrasse 26, CH-8117, Fällanden, Switzerland

    S. Plesko, P. Grossmann, M. Allemann & H. P. Kellerhals

Authors
  1. S. Plesko
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  2. P. Grossmann
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  3. M. Allemann
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  4. H. P. Kellerhals
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

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© 1986 Springer-Verlag Berlin Heidelberg

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Plesko, S., Grossmann, P., Allemann, M., Kellerhals, H.P. (1986). Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance. In: Benninghoven, A. (eds) Ion Formation from Organic Solids (IFOS III). Springer Proceedings in Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82718-1_40

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  • DOI: https://doi.org/10.1007/978-3-642-82718-1_40

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82720-4

  • Online ISBN: 978-3-642-82718-1

  • eBook Packages: Springer Book Archive

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