Abstract
The semi-conductors themselves as well as the convertes and converter installations are tested according to their designed properties (electrical, thermal, etc.) [14.1, 14.2] . A distinction is made between type tests and individual tests ( routine tests) .
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References
Harrison, R.E.; Shemie, R.K.; Krishnayya, P.C.S.: A Proposed Test Specification for HVDC Thyristors Valves. IEEE Trans. on Power Apparatus and Systems, Vol. PAS-97, No. 6 (1978) 2207–2214
Buri, H.; Leipold, Ph.: Anwendungsbezogene Prüfungen schneller Thyristoren. BBCNachr. Nr. 12 (1979) 459–464
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© 1986 Springer-Verlag Berlin Heidelberg
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Heumann, K. (1986). Tests. In: Basic Principles of Power Electronics. EESES Electric Energy Systems and Engineering Series. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82674-0_14
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DOI: https://doi.org/10.1007/978-3-642-82674-0_14
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