Abstract
Laser annealing has gained much interest in the last few years, and it was first widely thought that this new method would soon be a standard technique in semiconductor processing. This euphoric opinion, however, has to be scaled down to the real possibilities of this new and exciting technique.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
R.T. Young, J. Narayan, W.H. Christie, G.A. van der Leeden, J.I. Levatter, and L.J. Cheng, Solid State Technology, Nov. 1983, p. 183
Y.J. Nissim, A. Lietoila, R.B. Gold, and J.F. Gibbons, J. Appl. Phys. 51, 1 (1980)
L. Csepregi, J.W. Mayer, and T.W. Sigmon, Phys. Lett. 54A, 157 (1975)
S.A. Kokorowski, G.L. Olson, and L.D. Hess, J. Appl. Phys. 53, 921 (1982)
P. Baeri and S. Campisano in: Laser Annealing of Semiconductors (Eds. J.M. Poate and J.W. Mayer) p. 75, Acad. Press, New York (1982)
J.F. Gibbons, in: Ion Implantation: Equipment and Techniques (Eds.: H. Ryssel and H. Glawischnig), Springer Series in Electrophysics, Vol. 11 (1983) p. 482
R.A. Powell, T.O. Yep, and R.T. Fulks, Appl. Phys. Lett. 39, 150 (1981)
D.F. Downey, C.J. Russo, and J.T. White, Solid State Technol. Sept. 1982, p. 87
A.G. Cuilis, H.C. Webber, and P. Bailey, J. Phys. E 12, 688 (1979)
D.E. Aspnes, G.K. Celler, J.M. Poate, G.A. Rozgonyi, and T.T. Sheng in: Laser and Electron Beam Processing of Electronic Materials (Eds.: C.L. Anderson, G.K. Celler, and G.A. Rozgonyi), p. 414, Electrochem. Soc., Pennington, New Jersey
C. Hill, in: Laser and Electron Beam Processing of Electronic Materials (see [10]) p. 26
J. Götzlich, P.H. Tsien, and H. Ryssel, Proc. of the Mat. Res. Soc. Meeting, Boston 1983 (to be published)
P.H. Tsien, J. Götzlich, H. Ryssel, and I. Rüge, J. Appl. Phys. 53, 663 (1982)
J. Götzlich, P.H. Tsien, G. Henghuber, and H. Ryssel, in: Ion Implantion: Equipment and Techniques (see [6]) p.513
R.T. Young, R.F. Wood, and W.H. Christie, J. Appl. Phys. 53, 1178 (1982)
J.C. Muller and P. Siffert, Rad. Effects 63, 81 (1982)
D.H. Lowndes, J.W. Cleland, W.H. Christie, R.W. Eby, G.E. Jellison jr., J. Narayan, R.D. Westbrook, R.F. Wood, J.A. Nilson, and S.C. Dass, in: Laser Solid Interactions and Transient Thermal Processing of Materials, (eds. J. Narayan, W.L. Brown, R.A. Lemons) p. 407, North-Holland, N.Y. (1983)
L.D. Hess, G.L. Olson, C.R. Ito, and E.M. Nakaji, in: Laser and Electron Beam Processing of Materials (Eds. C.W. White and P.S. Peercy) p. 621, Acad. Press., N.Y. (1980)
M. Lindner, Phys. Stat. Sol. A 57, 263 (1980)
N. Natsuaki, T. Miyazaki, M. Ohkura, T. Nakamura, M Tamura, and T. Tokiyama in: Laser and Electron Beam Solid Interactions and Materials Processing (Eds. J.F. Gibbons, L.D. Hess, and T.W. Sigmon) p. 375, North-Holland, N.Y. (1981)
M.Miyao, M. Koyanagi, H. Tamura, N. Hashimoto and T. Tokuyama, Jap. Journ. Appl. Phys. 19, Suppl. 19 - 1, 129 (1980)
L.D. Hess, S.A. Kokorowski, G.L. Olson, Y.M. Chi, A. Gupta and J.B. Valdez, in: Laser and Electron Beam Interactions with Solids, (Eds. B.R. Appleton and G.K. Celler) p. 633, North-Holland, N.Y. (1982)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1984 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Götzlich, J., Ryssel, H. (1984). Applications of Laser Annealing. In: Bäuerle, D. (eds) Laser Processing and Diagnostics. Springer Series in Chemical Physics, vol 39. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82381-7_7
Download citation
DOI: https://doi.org/10.1007/978-3-642-82381-7_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-82383-1
Online ISBN: 978-3-642-82381-7
eBook Packages: Springer Book Archive