Abstract
Phase transformation in condensed matter is an important area of study in solid state physics since it relates to the genesis and evolution of new microstructure. The mechanisms responsible in such critical phenomena are still not fully understood. Previous experimental information has left unmeasured such important parameters as the minimum number of nuclei and their common critical radius for a transformation to occur as well as the interphase velocity. Several probe techniques have now been developed to time-resolve phase transformations in semiconductors during laser annealing. However, most of these probes (eg. electrical conductivity,1,2 optical reflection,3,4 optical transmission,5 Raman scattering,6 and time of flight mass spectrometry7) supply no direct information about the atomic structure of the material. Probing the structure can reveal when and to what degree a system melts as it is defined by degradation in the long range order of the lattice. True structural probes based on x-ray8 and low energy electron9 diffraction and EXAFS10 with nanosecond time resolution have been developed offering fresh insight into both the bulk and surface dynamics of material structure. Also, a subpicosecond probe based on structural dependent second harmonic generation11 has been demonstrated. But at present, only the technique of picosecond electron diffraction12 can produce an unambiguous picture of the structure on the picosecond timescale. In this letter we report on the results of using this probe to directly observe the laser-induced melting of aluminum.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
M. Yamada, H. Kotani, K. Yamazaki, K. Yamamoto, and K. Abe, J. Phys. Soc. Japan, 49, 1299 (1980).
G.J. Galvin, M.O. Thompson, J.W. Mayer, R.B. Hamond, N. Paulter and P.S. Peercy, Phys. Rev. Lett., 48, 33 (1982).
D.H. Auston, C.M. Surko, T.N.C. Venkatesan, R.E. Slusher, and J.A. Golovchenko, Appl. Phys. Lett., 33, 437 (1978).
C.V. Shank, R. Yen, and C. Hirlimann, Phys. Rev. Lett., 50, 454 (1983).
J.M. Liu, H. Kurz, and N. Bloembergen, Appl. Phys. Lett, 41, 643 (1982).
H.W. Lo and A. Compaan, Phys. Rev. Lett., 44, 1604 (1980)
A. Pospieszczyk, M.A. Harith, and B. Stritzker, J. Appl. Phys., 54, 3176 (1983).
B.C. Larson, C.W. White, T.S. Noggle, and D. Mills, Phys. Rev. Lett., 48, 337 (1982).
R.S. Becker, G.S. Higashi, and J.A. Golovchenko, Phys. Rev. Lett., 52, 307 (1984).
H.M. Epstein, R.E. Schwerzel, P.J. Mallozzi, and B.E. Campbell, J. Am. Chem. Soc., 105, 1466 (1983).
C.V. Shank, R. Yen, and C. Hirliman, Phys. Rev. Lett., 51, 900 (1983).
G. Mourou and S. Williamson, Appl. Phys. Lett., 41, 44 (1982).
D.J. Bradley and W. Sibbett, Appl. Phys. Lett., 27, 382 (1975).
G. Mourou and W. Knox, Appl. Phys. Lett., 36, 623 (1980).
S. Williamson, G. Mourou, and S. Letzring, Proc. 15th Int. Cong. on High Speed Photography, Vol. 348 (I), 197 (1983).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1984 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Williamson, S., Mourou, G., Li, J.C.M. (1984). Time-Resolved Laser-Induced Phase Transformation in Aluminum. In: Auston, D.H., Eisenthal, K.B. (eds) Ultrafast Phenomena IV. Springer Series in Chemical Physics, vol 38. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82378-7_33
Download citation
DOI: https://doi.org/10.1007/978-3-642-82378-7_33
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-82380-0
Online ISBN: 978-3-642-82378-7
eBook Packages: Springer Book Archive