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Ion Dose Effect in Thin Film Formation on Nb(100)

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

Abstract

The growth of metal films under the influence of ion bombardment has attracted considerable interest recently in connection with ion beam deposition. In ion beam deposition condensation and surface damage are not separable. Such a separation is, however, possible if the metal is thermally evaporated in small doses and bombarded in between doses with ions whose nature, energy and angle of incidence can be chosen freely. The secondary ions produced by these ions can simultaneously be used to characterize the film. We have studied the initial growth of Cu and Pd on Nb(100) in this manner. These two systems differ fundamentally in that Pb alloys with Nb while Cu does not. A comparison of the two systems should, therefore, give some insight into the influence of alloyibility on the ion beam influence.

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References

  1. E.Bauer, H.Poppa, G.Todd and F.Bonczek, J.Appl.Phys. 45, 5164 (1974).

    Article  CAS  Google Scholar 

  2. F.Soria and H.Poppa, J.Vac.Sci.Technol. 17, 449 (1980).

    Article  CAS  Google Scholar 

  3. E.Bauer, H.Poppa and Y.Viswanath, Surface Sci. 58, 517 (1976).

    Article  CAS  Google Scholar 

  4. W.Schlenk and E.Bauer, Surface Sci. 93, 9 (1980).

    Article  CAS  Google Scholar 

  5. S.Prigge, H.Roux and E.Bauer, Surface Sci. 107, 101 (1981).

    Article  CAS  Google Scholar 

  6. C.Park, E.Bauer and H.Poppa, to be published.

    Google Scholar 

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© 1984 Springer-Verlag Berlin Heidelberg

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Koshikawa, T., Prigge, S., Bauer, E. (1984). Ion Dose Effect in Thin Film Formation on Nb(100). In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_56

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_56

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

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