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Secondary Ion Emission Peculiarities at Metal Interfaces

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

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Abstract

Specific physical and chemical states of interfaces are known to affect substantially the parameters of emission processes. Therefore it is of interest to investigate peculiarities of such a surface-sensitive phenomenon as the secondary ion emission (SIE) on the boundary of different metal phases. The present work deals with the study of thin metal film - metal substrate interfaces.

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References

  1. V.T. Cherepin, M.A. Vasilyev: Vtorichnaya ionno-ionnaya emissiya metallov i splavov (Naukova Dumka, Kiev, 1975)

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  2. M.A. Vasilyev, A.B. Goncharenko, S.P. Chenakin, V.T. Cherepin: Sov. Metallofizika 2, N5, 113 (1980)

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Author information

Authors and Affiliations

  1. Institute of Metal Physics, Academy of Sciences of the UkrSSR, Vernadskogo 36, Kiev, 252142, USSR

    M. A. Vasilyev & S. P. Chenakin

Authors
  1. M. A. Vasilyev
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  2. S. P. Chenakin
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Editor information

Editors and Affiliations

  1. Phsysikalisches Inst., Universität Münster, Münster, D-4400, Fed. Rep. of Germany

    A. Benninghoven

  2. College of General Education, Osaka University, Osaka 560, Japan

    J. Okano

  3. Department of Applied Physics, Osaka University, Osaka 565, Japan

    R. Shimizu

  4. Philips Research Laboratories, Eindhoven, The Netherlands

    H. W. Werner

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© 1984 Springer-Verlag Berlin Heidelberg

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Vasilyev, M.A., Chenakin, S.P. (1984). Secondary Ion Emission Peculiarities at Metal Interfaces. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_13

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

  • eBook Packages: Springer Book Archive

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