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Quantitative SIMS Analysis of Metastable Plagioclase in Boggild Intergrowth

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

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Abstract

Quantitative SIMS data can be obtained either by using working curve methods based both on combined secondary ion microprobe and electron microprobe analyses [1, 2] or using various methods of purifying of each isotopic peak [3]. Although almost all SIMS studies on geological samples are made on natural and synthesized crystals and glasses, few applications to metastable minerals showing exsolved microstructure are found mainly because of difficulty in explanation of inhomogeneity of the surface and the formation process.

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References

  1. Y. Miúra and T. Tomisaka, American Mineralogist 63 584 (1978).

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Author information

Authors and Affiliations

  1. Department of Mineralogical Sciences and Geology, Faculty of Sciences, Yamaguchi University, 1677-1 Yoshida, Yamaguchi 753, Japan

    Y. Miura & T. Tomisaka

Authors
  1. Y. Miura
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  2. T. Tomisaka
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Editor information

Editors and Affiliations

  1. Phsysikalisches Inst., Universität Münster, Münster, D-4400, Fed. Rep. of Germany

    A. Benninghoven

  2. College of General Education, Osaka University, Osaka 560, Japan

    J. Okano

  3. Department of Applied Physics, Osaka University, Osaka 565, Japan

    R. Shimizu

  4. Philips Research Laboratories, Eindhoven, The Netherlands

    H. W. Werner

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© 1984 Springer-Verlag Berlin Heidelberg

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Miura, Y., Tomisaka, T. (1984). Quantitative SIMS Analysis of Metastable Plagioclase in Boggild Intergrowth. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_119

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_119

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

  • eBook Packages: Springer Book Archive

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